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  • 1
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The InAs/Ga1−xInxSb strained-layer superlattice (SLS) holds promise as an alternative III–V semiconductor system for long wavelength infrared detectors. In this article, we present the first investigation, to the best of our knowledge, of heterojunction photodiodes using this new material. The devices were grown by molecular beam epitaxy on GaSb substrates, and are comprised of a 38 A(ring) InAs/16 A(ring) Ga0.64In0.36Sb SLS used in double heterojunctions with GaSb contact layers. The structures were designed to optimize the quantum efficiency while minimizing transport barriers at the heterointerfaces. The photodiodes are assessed through the correlation of their performance with the SLS material quality and the detector design. X-ray diffraction, absorption, and Hall measurements are used to determine the SLS material properties. The electrical and optical properties of the photodiodes are determined using current–voltage and spectral responsivity measurements. At 78 K, these devices exhibit rectifying electrical behavior and photoresponse out to a wavelength of 10.6 μm corresponding to the SLS energy gap. The responsivity and resistance in these thin-layered (0.75 μm), unpassivated photodiodes result in a detectivity of 1×1010 cm (square root of)Hz/W at 8.8 μm and 78 K. Based upon the performance of these devices, we conclude that high-sensitivity operation of long-wavelength photovoltaic detectors at temperatures well in excess of conventional III–V band gap-engineered systems, and potentially in excess of HgCdTe, is feasible using this material system. © 1996 American Institute of Physics.
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  • 2
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: InAs/InGaAs self-assembled quantum dots (SADs) are fabricated on (311)B GaAs by molecular-beam epitaxy using the Stranski–Krastanow growth mode. The critical thickness for the SAD formation on (311)B substrates is almost the same as that on (100) surface, characterized by in situ reflection high-energy electron-diffraction pattern changes. Atomic force microscopy observation on In0.5Ga0.5As SADs showed uniform nanometer scale quantum dots with a typical dot diameter of around 25 nm ±2 nm and a typical height of 13.7 nm ±2.2 nm. In photoluminescence measurements, an intense peak from the SADs is observed with a sharp luminescence from the wetting layer that exists two-dimensionally underneath the SAD structure. A compound SAD structure is proposed where the composition of the wetting layer and the SAD layer are different. This is intended to suppress the luminescence from the wetting layer. The narrowest full widths at half-maximum of the luminescence from the compound SADs on (311)B are about 35 meV at 2 K and 41 meV at room temperature, respectively, which are much narrower than those measured from reference (100) SADs. The PL linewidth is not strongly affected by the measurement temperature, indicating that the linewidth is mainly governed by inhomogeneous broadening due to the dot size distribution. These narrow PL spectra demonstrate an advantage of using (311)B substrates for SAD formation in molecular-beam epitaxy. A shoulder peak distinctly observed in the SAD luminescence corresponds to the transition between the second quantum level in the SADs, as estimated from a simple calculation of the quantum confinement energy as well as excitation-intensity-dependent photoluminescence measurements. © 1996 American Institute of Physics.
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 3578-3580 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report on the use of shadow masks for the growth of GaAs quantum wells with spatially varying thicknesses. Using cathodoluminescence we observe a clear shift of the luminescence energy as a function of the lateral position. Combining masked and directional epitaxy, the quantum wells can be both laterally and vertically patterned. This way, stacked, two-dimensional electron gases are realized which can be selectively contacted without the use of complicated in-situ or post-growth patterning techniques. The quality of the epitaxial material grown through the openings of the masks is investigated by optical and electrical characterization. © 1995 American Institute of Physics.
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 69 (1998), S. 1403-1405 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A two-dimensional ultrahigh vacuum compatible positioner is presented. The positioner uses two piezoelectric inchworms which allow for motions of up to 1 cm with a precision of 4 nm mounted at right angles to each other in order to give two dimensions of motion. Images of three-dimensional In0.3Ga0.7As islands in cross section are presented to demonstrate the functionality of the positioner. It is found that motion towards the tip is smooth, while motion in the perpendicular direction is less smooth. © 1998 American Institute of Physics.
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 3591-3593 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We describe a new process for making submicron, micromechanical cantilevers out of GaAs epilayers grown by molecular beam epitaxy. The extremely high aspect ratios of these cantilevers (typically 100 nm thick and 100 μm long) give spring constants as low as 10−4 N/m. We present characterizations of the cantilevers' resonant frequencies, quality factors, and spring constants. The ability to fabricate III–V GaAs-based mechanical microstructures offers new opportunities for integration with electronics for strain-sensitive force detection. © 1996 American Institute of Physics.
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  • 6
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 67 (1995), S. 2816-2818 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The dc I–V characteristic of a triple-barrier resonant tunneling diode (RTD) integrated in a bowtie antenna and driven by THz radiation displays up to five additional resonant tunneling channels. These channels appear as additional peaks in the I–V characteristic whose voltage positions vary linearly with frequency in the investigated range between ν=1.0 and 3.4 THz. We attribute these peaks to photon-assisted tunneling processes corresponding to absorption and stimulated emission of up to three photons. The experiments suggest that such a device can be utilized to detect and generate THz radiation. © 1995 American Institute of Physics.
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  • 7
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 67 (1995), S. 3795-3797 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We use molecular beam epitaxy to grown coherently strained InGaAs islands on (100) GaAs substrates. The islands show room-temperature photoluminescence at 1.3 μm with a full width at half-maximum of only 28 meV. The integrated photoluminescence intensity is comparable to that of a quantum well. The islands are formed by depositing 22 monolayers of In0.3Ga0.7As with alternating beams of In, Ga, and As2. Atomic force microscopy measurements show that the islands are ellipsoidal sections with an average peak height of 24 nm. The intersection of the islands with the (100) plane is an ellipse whose major axis is along [011¯] and has a mean length of 54 nm, and whose minor axis is along [011] and has a mean length of 36 nm. The islands form a dense array with an areal coverage of about 40%. © 1995 American Institute of Physics.
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  • 8
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 67 (1995), S. 3165-3167 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Well-defined plasma oscillations are observed in a superlattice miniband even though the Fermi energy lies in the minigap. Despite the complex band structure, the resonance shows a remarkable insensitivity to changes in the number of electrons in the parabolic well in which the superlattice is placed, a feature of the generalized Kohn theorem that is expected only in the limit that the Fermi energy is near the bottom of the lowest miniband. © 1995 American Institute of Physics.
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  • 9
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 68 (1996), S. 1365-1367 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Hydrogen passivation of high quality AlGaAs/GaAs:Be quantum wells (QWs) is studied by photoluminescence (PL) spectroscopy. The interaction of hydrogen with both Be dopants and QW interfaces is analyzed. The efficiency of Be acceptor passivation by hydrogen is shown to be dependent on the Be concentration. By comparing the PL spectra of the QW structures with different doping level, before and after hydrogenation, a partial (up to 50%) deactivation of Be atoms is revealed. It is also shown that a prolonged hydrogenation strongly degrades the interface sharpness, presumably due to hydrogen-enhanced intermixing. © 1996 American Institute of Physics.
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  • 10
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 71 (1997), S. 2020-2022 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This letter describes the fabrication of functional GaAs/AlGaAs field effect transistors using micromolding in capillaries—a representative soft lithographic technique. The fabrication process involved three soft lithographic steps and two registration steps. Room temperature characteristics of these transistors resemble those of field effect transistors fabricated by photolithography. The fabrication of functional microelectronic devices using multilayer soft lithography establishes the compatibility of these techniques with the processing methods used in device fabrication, and opens the door for their development as a technique in this area. © 1997 American Institute of Physics.
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