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Observation of a vacuum tunnel gap in a transmission electron microscope using a micromechanical tunneling microscope (1995)

Lutwyche, M. I. ; Wada, Y.

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 66 (1995), S. 2807-2809

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ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: This letter reports the observation of the vacuum tunnel gap between two conductors using a high resolution transmission electron microscope. A 2.5 mm square micromachined tunneling microscope chip has been fabricated with a minimum feature size of 0.4 μm. The chip fits into a modified side-entry type transmission electron microscope holder. The tunnel gap is controlled by a purpose-built feedback controller. The micromachines work reliably during observation of the tip apex in a transmission electron microscope, allowing the voltage and current to be changed while the tunnel gap is observed. © 1995 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.113482

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