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  • American Institute of Physics (AIP)  (1)
  • 1995-1999  (1)
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    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 72 (1998), S. 1394-1396 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: BaTiO3/SrTiO3 multilayered thin films were deposited on Si and Pt/Si substrates. X-ray diffraction clearly shows the formation of the superstructures. Phase transition properties were studied via dielectric measurements. Glassy behavior, characterized by a strong frequency dispersion of dielectric properties, was found in samples with a total thickness of 400 nm, while in samples with a total thickness of 800 nm, normal ferroelectric phase transitions with two dielectric peaks were observed. A preliminary interpretation assumes that size effects which frustrate long range ferroelectric ordering may lead to the relaxational behavior in BaTiO3/SrTiO3 superstructures. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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