ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
BaTiO3/SrTiO3 multilayered thin films were deposited on Si and Pt/Si substrates. X-ray diffraction clearly shows the formation of the superstructures. Phase transition properties were studied via dielectric measurements. Glassy behavior, characterized by a strong frequency dispersion of dielectric properties, was found in samples with a total thickness of 400 nm, while in samples with a total thickness of 800 nm, normal ferroelectric phase transitions with two dielectric peaks were observed. A preliminary interpretation assumes that size effects which frustrate long range ferroelectric ordering may lead to the relaxational behavior in BaTiO3/SrTiO3 superstructures. © 1998 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.121066
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