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  • American Institute of Physics (AIP)  (3)
  • 1995-1999  (3)
  • 1940-1944
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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 3513-3519 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The first attempt to combine luminescence spectroscopy with scanning soft x-ray microscopy has been realized in our experiment. A new imaging luminescence spectrometer with a Schwarzschild objective was designed and built with a spectral resolution of 1.3 nm in the energy range of 1.6–6.5 eV for this purpose. Some luminescent ceramics have been investigated by using this spectrometer. A high contrast in luminescence micrographs is achieved due to the confocal arrangement of the Schwarzschild system and the microscope. The spectral and microstructural properties of these ceramics could be determined by means of luminescence microspectroscopy and spectromicroscopy. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 2021-2029 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Optical elements need to be developed at least at the same pace as synchrotron radiation sources of the third generation. We are concerned here with the interrelationship between improved optical instruments and scientific progress. This relationship becomes especially clear in the development of new monochromators with higher resolution and large throughput. The availability of better mirrors and gratings is most important in this respect. Another field is microscopy. We shall be concerned here mainly with scanning microscopy in which the radiation is imaged with mirrors onto a small spot on the sample. The respective imaging with zone plates is the topic of another paper. A spot size of 0.1 μm and better is theoretically feasible with mirrors but it depends on much progress in the manufacturing of aspherical mirrors of high accuracy. We demonstrate mainly from our own results with a spot in the 1 μm range that it is worthwhile to make this effort. © 1995 American Institute of Physics.
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 85 (1999), S. 4610-4612 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We demonstrate the feasibility of the vacuum ultraviolet analog to visible-light magneto-optical imaging of magnetic structures using the resonantly enhanced transverse magneto-optical Kerr effect at core level thresholds with incident p-polarized radiation. The advantages are element specificity and a variable information depth. We used the scanning x-ray microscope at HASYLAB capable of obtaining about 1 μm resolution by means of its focusing ellipsoidal ring mirror. The p-polarized component of the reflected light was selected using multilayer reflection at an additional plane mirror downstream to the sample. Micrographs of the optical reflectivity were taken in the vicinity of the Fe 3p core level threshold at 53.7 and 56.5 eV photon energy where the magneto-optical effect is of opposite sign. Magnetic domains are visible in the difference of both recorded images. © 1999 American Institute of Physics.
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