ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A new tandem time-of-flight mass spectrometer is described which is designed to study the mass-, velocity-, and angle-resolved scattering of cluster ions from solid surfaces. Clusters are produced in a supersonic jet laser desorption/vaporization source, ionized either directly in the formation step or by subsequent photoionization of neutrals, mass selected in a primary time-of-flight region, and decelerated to the impact energy (50–1000 eV) close to the target surface. Cluster–surface collisions take place in a field-free region in order to determine both velocity and angular distributions of the scattered clusters and fragments with an independently pulsed, rotatable secondary time-of-flight mass spectrometer. Several surface targets can be mounted in the UHV scattering chamber (10−10 Torr base pressure) on a five-axis manipulator which, together with the rotatable secondary TOF, allows for independent variation of incident and scattering angles. Target surfaces can be cleaned by direct current heating and sputtering with an argon-ion gun. Surface structure and composition are assessed by low-energy electron diffraction (LEED) and Auger spectroscopy with a four grid reverse view LEED/Auger system. Surface collision experiments of fullerenes (C+60, C+70, C+76, C+84, ...) and metallofullerenes (La@xaC+82) with highly oriented pyrolitic graphite (HOPG) surfaces are described as examples for the performance of the instrument. Effects of surface contamination in the scattering of fullerenes from HOPG are described to demonstrate the need for thorough cleaning procedures in order to obtain reproducible results. © 1995 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1145369
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