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  • American Institute of Physics (AIP)  (5)
  • 1995-1999  (2)
  • 1985-1989  (3)
  • 1935-1939
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  • 1995-1999  (2)
  • 1985-1989  (3)
  • 1935-1939
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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 60 (1986), S. 2301-2303 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Using microcleavage transmission electron microscopy and x-ray diffraction, we have studied the anomalous expansion observed in tungsten-carbon multilayers. Our results show that the expansion is mostly due to an agglomeration of the tungsten and the effect is larger for samples that have a thinner tungsten layer. Implications for soft x-ray optics are discussed.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 65 (1989), S. 4250-4255 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Results are presented from a glancing angle extended x-ray absorption fine structure study to investigate the structure of W/C multilayers and the effects of moderate annealing. There is evidence of considerable interlayer mixing prior to any heat treatment. It is found that after annealing to 350 °C for several hours, drastic changes can occur in the structural environment of the W atoms, with minimal changes in the reflectivity of the sample. There is extensive formation of W2C depending on the W thickness and the W/C ratio. Identification of this carbide as the product of annealing is unambiguous. Above a critical thickness, W begins to grow in its bcc form within the W layer, as it is prepared. This bcc layer is unaffected by the annealing process. The presence of carbon is shown to stabilize the amorphous state of W and inhibits any formation of W2C when the W thickness and W/C ratio are small.
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 70 (1999), S. 3227-3232 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have developed a design method to produce laterally graded multilayer x-ray mirrors based on sputter deposition techniques. The optimization of all relevant parameters yields an ab initio estimation of any layer gradient suitable to achieve precise x-ray focusing devices. The performance and the accuracy of this method are demonstrated. A graded W/B4C multilayer was deposited on a flat substrate that was bent to a parabola. The obtained nonlinear lateral gradient differed from the theoretical calculations by less than 1%. Focusing experiments performed at an x-ray energy of 8 keV on the ESRF optics beamline revealed an excellent performance with a focal spot size of about 7 μm. © 1999 American Institute of Physics.
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 3356-3356 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: In the last decades, the major motivation for manufacturing multilayer mirrors has been in soft x-ray applications, particularly for astronomy, microlithography, and polarimetry. The advent of high energy synchrotron storage rings has provided a new significant impetus emphasizing high energy applications and especially when flux, rather than resolution, is desired. In this paper we present the reflection properties of the most promising multilayer material combinations for the energy range from 0.1 keV up to 200 keV. Previous calculations by Rosenbluth were limited to a maximum of 2 keV and to multilayers composed of pure elements and operating under normal incidence. As alloys might be essential for a smooth growth and/or for stability under high heat load, our screening consisted of a list of up to 300 solids having a melting point above 100°C and that could be deposited in a sputtering process. A full computer search calculates 45000 multilayer combinations for each angle (or multilayer d-spacing) and energy of operation, the only necessary input variables. Other manufacture-related parameters can be specified to give a more realistic picture of the performance. As the number of layers is often limited, a nonperiodic design could minimize absorption effects. © 1996 American Institute of Physics.
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  • 5
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The use of multilayer reflectors under intense synchroton x-ray beams requires to develop a new generation of multilayered materials that can withstand a high-power load in excess of 100 W/mm2. Multilayers with the high-Z layer consisting either of a pure element or of compounds such as carbides, nitrides, or silicides have been produced. Because the fabrication conditions are not yet optimized, thin films with satisfactory layer were not obtained leading to poor reflectivities. Such multilayers have been both thermally annealed in a furnace and exposed to a synchrotron beam with a power density of about 1 W/mm2. The resulting damage ranges from the total destruction of the layering to a reduction of the reflectivity by typically 40%–60%. In some cases an only 1%–15% loss in reflectivity has been observed.
    Type of Medium: Electronic Resource
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