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  • 42C15  (1)
  • 78.65J  (1)
  • Springer  (2)
  • American Geophysical Union (AGU)
  • American Institute of Physics
  • 1995-1999  (1)
  • 1990-1994  (1)
  • 1905-1909
Collection
Publisher
  • Springer  (2)
  • American Geophysical Union (AGU)
  • American Institute of Physics
Years
  • 1995-1999  (1)
  • 1990-1994  (1)
  • 1905-1909
Year
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    The journal of Fourier analysis and applications 5 (1999), S. 589-597 
    ISSN: 1531-5851
    Keywords: 42C15 ; 39B99 ; multivariate ; nonhomogeneous ; refinement
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mathematics
    Notes: Abstract We give necessary and sufficient conditions for the existence and uniqueness of compactly supported distribution solutionsf=(f 1,...,f r)T of nonhomogeneous refinement equations of the form $$f(x) = h(x) + \sum\limits_{\alpha \in A} {c_\alpha f(2x - \alpha )(x \in R^s )} $$ , where h=(h1,...,hr)Tis a compactly supported vector-valued multivariate distribution, A⊂Z+ s has compact support, and the coefficientsc α are real-valued r×r matrices. In particular, we find a finite dimensional matrix B, constructed from the coefficientsc α of the equation (I−B)q=p, where the vectorp depends on h. Our proofs proceed in the time domain and allow us to represent each solution regardless of the spectral radius of P(0):=2−s∑c α , which has been a difficulty in previous investigations of this nature.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 54 (1992), S. 293-299 
    ISSN: 1432-0630
    Keywords: 68.55 ; 73.60F ; 78.65J ; 81.15E
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Stoichiometric polycrystalline In2Se3 thin films have been grown by elemental evaporation on both glass and quartz substrates. The compositions are examined by DAN fluorimetry and X-ray photoelectron spectroscopy (XPS). Structure of the films are characterized by X-ray diffraction. The structure of this α-form of thin films have been determined to be hexagonal. Optimization of the preparative conditions employed for elemental evaporation, helped in preparing monophasic films by the suppression of other phases to a very minor extent. Influence of annealing conditions on the stoichiometry of the films are investigated in detail.
    Type of Medium: Electronic Resource
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