ISSN:
1434-6036
Keywords:
PACS. 73.61.At Metal and metallic alloys – 68.55.Jk Structure and morphology; thickness; crystalline orientation and texture – 81.40.Rs Electrical and magnetic properties
Source:
Springer Online Journal Archives 1860-2000
Topics:
Physics
Notes:
Abstract: The electronic properties of thin metallic films strongly depend on their structure. For the preparation of ultrathin films (0.8 to 12 ML) Pb was grown on a Si (111)-7×7 structure at temperatures below 25 K. Percolation as measured by DC conductance starts at 0.7 ML. Up to 4 ML the growing film is disordered. During continuation of the growth the film recrystallizes epitaxially and layer-by-layer growth connected with oscillations of conductivity and LEED intensities is observed even at 25 K. The defect structure as determined by SPA-LEED and the quantum size effect allow a quantitative description of the conductivity oscillations. The experiments show, that the electronic properties of ultrathin Pb films are clearly correlated with the structural properties of the film.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1140/epjb/e2002-00364-9
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