ISSN:
1063-7834
Source:
Springer Online Journal Archives 1860-2000
Topics:
Physics
Notes:
Abstract The paper reports the study on the resistivity ρ and thermoemf S of the (Sn0.65Pb0.35)0.95Ge0.05Te solid solution layers. The dependences of ρ and S on the hole concentrations in the range 3×1019–2×1021 cm−3 exhibit jumps in the resistivity and thermoemf minima at close hole concentrations p 1≈9×1019 cm−3, p 2≈2.5×1020 cm−3, and p 3≈4.5×1020 cm−3. The observed jumps and minima suggest a complex structure of the valence band and the presence of critical points in the energy spectrum of holes. According to the data for SnTe, the critical points in the energy spectrum at the given hole concentrations are identified as the Σ-extremum, saddle point LΣ, and Δ-extremum, respectively.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1134/1.1131262
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