ISSN:
1089-7623
Quelle:
AIP Digital Archive
Thema:
Physik
,
Elektrotechnik, Elektronik, Nachrichtentechnik
Notizen:
In order to achieve the strictest tolerances required in the manufacturing of an x-ray interferometer of the triple Laue type (LLL) to be used in the accurate determination of the silicon lattice parameter, a new shape of the analyzer crystal is considered. The simulation of its behavior proves that, if specified elastic and thermal load upper limits are satisfied, the lattice plane deformations are compatible with a measurement uncertainty of a few parts in 109. © 2000 American Institute of Physics.
Materialart:
Digitale Medien
URL:
http://dx.doi.org/10.1063/1.1150526
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