Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
72 (2001), S. 1589-1590
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
Graphite coated with a thin layer of photoresist and annealed in an inert ambient to vitrify the coating makes light, smooth substrates that are as good as polished diamond for the analysis of thin films by MeV He backscattering spectrometry. © 2001 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1334623
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