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Synchrotron X-Ray Diffraction Analysis of Meteorites in Thin Section: Preliminary Results (2004)

Xirouchakis, D. ; Treiman, A. H. ; Lanzirotti, A.

In: CASI

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Publication Date: 2019-07-10

Description: X-ray diffraction is the pre-eminent technique for mineral identification and structure determination, but is difficult to apply to grains in thin section, the standard meteorite preparation. Bright focused X-ray beams from synchrotrons have been used extensively in mineralogy and have been applied to extraterrestrial particles. The intensity and small spot size achievable in synchrotron X-ray beams makes them useful for study of materials in thin sections. Here, we describe Synchrotron X-ray Diffraction (SXRD) in thin section as done at the National Synchrotron Light Source, and cite examples of its value for studies of meteorites in thin section.

Keywords: Lunar and Planetary Science and Exploration

Type: Lunar and Planetary Science XXXV: Martian Meteorites: Chemical Weathering; LPI-Contrib-1197

Format: text

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