Publication Date:
2019-07-12
Description:
A combination of pulsed-source interferometry and acoustic diffraction has been proposed for use in imaging subsurface microscopic defects and other features in such diverse objects as integrated-circuit chips, specimens of materials, and mechanical parts. A specimen to be inspected by this technique would be mounted with its bottom side in contact with an acoustic transducer driven by a continuous-wave acoustic signal at a suitable frequency, which could be as low as a megahertz or as high as a few hundred gigahertz. The top side of the specimen would be coupled to an object that would have a flat (when not vibrating) top surface and that would serve as the acoustical analog of an optical medium (in effect, an acoustical "optic").
Keywords:
Instrumentation and Photography
Type:
NPO-20478
,
NASA Tech Briefs, March 2003; 19
Format:
application/pdf
Permalink