Publication Date:
2004-04-10
Description:
Plastic deformation in coarse-grained metals is governed by dislocation-mediated processes. These processes lead to the accumulation of a residual dislocation network, producing inhomogeneous strain and an irreversible broadening of the Bragg peaks in x-ray diffraction. We show that during plastic deformation of electrodeposited nanocrystalline nickel, the peak broadening is reversible upon unloading; hence, the deformation process does not build up a residual dislocation network. The results were obtained during in situ peak profile analysis using the Swiss Light Source. This in situ technique, based on well-known peak profile analysis methods, can be used to address the relationship between microstructure and mechanical properties in nanostructured materials.〈br /〉〈span class="detail_caption"〉Notes: 〈/span〉Budrovic, Zeljka -- Van Swygenhoven, Helena -- Derlet, Peter M -- Van Petegem, Steven -- Schmitt, Bernd -- New York, N.Y. -- Science. 2004 Apr 9;304(5668):273-6.〈br /〉〈span class="detail_caption"〉Author address: 〈/span〉Paul Scherrer Institute, CH-5232 Villigen PSI, Switzerland.〈br /〉〈span class="detail_caption"〉Record origin:〈/span〉 〈a href="http://www.ncbi.nlm.nih.gov/pubmed/15073373" target="_blank"〉PubMed〈/a〉
Print ISSN:
0036-8075
Electronic ISSN:
1095-9203
Topics:
Biology
,
Chemistry and Pharmacology
,
Computer Science
,
Medicine
,
Natural Sciences in General
,
Physics
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