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  • Springer  (11)
  • Oxford University Press  (1)
  • Springer Nature
  • Wiley-Blackwell
  • 2000-2004  (13)
  • 11
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 19 (2000), S. 107-109 
    ISSN: 1573-4811
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
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  • 12
    Electronic Resource
    Electronic Resource
    Springer
    The European physical journal 42 (2004), S. 193-204 
    ISSN: 1434-6036
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract. Thin polycrystalline Ni films of typically 75 nm thickness evaporated on Si or SiO2 substrates were irradiated with 30-900 keV Xe-ions to fluences of 2.5 x 1013 - 4 x 1014/cm2. The magnetization of the Ni films was measured using the longitudinal Magneto-Optical Kerr Effect and Vibrating Sample Magnetometry. The Ni-film thickness and Xe-concentration profiles were determined with Rutherford backscattering spectroscopy and the lattice dilation with X-ray diffraction. The Xe-irradiations were found to induce an in-plane uniaxial magnetic anisotropy within the Ni-films. This magnetic texture was investigated in relationship to the microstructure as function of the ion energy and fluence, the sample temperature, the presence of an external magnetic field during the irradiation and the stress field produced before, during and after the implantations.
    Type of Medium: Electronic Resource
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  • 13
    ISSN: 1434-6036
    Keywords: PACS. 74.25.Nf Response to electromagnetic fields (nuclear magnetic resonance, surface impedance, etc.) - 74.20.De Phenomenological theories (two-fluid, Ginzburg-Landau, etc.) - 74.72.Fq Tl-based cuprates
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract: We report on the synthesis, structural and electrical characterization of high quality Tl2Ba2Ca1Cu2O8 (Tl-2212) superconducting films. The samples have been grown ex-situ on mm2 LaAlO3 (100) substrates by a combined approach of metal-organic chemical vapor deposition (MOCVD) and thallium vapor diffusion. The morphological and compositional nature of the c-axis oriented films has been investigated by SEM and X-ray analyses. Typical values of K and MA/cm2 at 77 K have been measured. Microwave measurements have been performed at f = 87 GHz inserting the film in a copper cavity and at f =1.5 GHz on patterned samples using a microstrip resonator technique. A penetration depth nm is evaluated by fitting the microwave data with phenomenological equations. The minimum value of the surface resistance measured at 4.2 K is 60 and 6 m at 1.5 GHz and 87 GHz respectively. The microwave data are described in the context of a modified two fluid model. An evaluation of the temperature dependence of the scattering rate has been performed through the simultaneous measurement of the surface resistance and the penetration depth.
    Type of Medium: Electronic Resource
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