Publication Date:
2004-01-01
Description:
A review of the application of transmission electron microscopy to the study of interface, composite and displacively modulated structures is given. The distinctly different mechanisms underlying structural modulation in each case are emphasized as is the practical application of transmission electron microscopy to problems such as pseudo-symmetry and twinning, to indexation in (3 +
Print ISSN:
2194-4946
Electronic ISSN:
2196-7105
Topics:
Geosciences
,
Physics
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