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  • 1
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 112 (2000), S. 7022-7031 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Three new ArHF (vHF=3) states, (3001), (3101), and (3111), have been observed between 11 350 and 11 420 cm−1 by the hot band transitions from (0001) using intracavity laser induced fluorescence. The term values and rotational constants of these levels are: (3001) ν0=11 385.928 98(28) cm−1, B=0.095 546(32) cm−1; (3101) ν0=11 444.258 12(68) cm−1, B=0.090 617(37) cm−1; and (3111) ν0=11 456.076 51(36) cm−1, B=0.091 863(14) cm−1. Observation of the ArHF (3001) state provides the van der Waals stretching frequency for ArHF at v=3, namely 46.8945(4) cm−1=(3001)–(3000). This value shows an increase of 8.208 cm−1 (21%) upon HF v=3←0 valence excitation. The stretching frequency for the T shaped ArHF is (3111)–(3110)=33.7055(5) cm−1. This value is only 7% greater than that observed at v=1. The (vHF101) Σ bend-stretch combination state, corresponding to (νs=1) of the Ar–FH configuration, has not been observed at vHF=0–2. The stretching frequency here is (3101)–(3100)=31.8178(8) cm−1. The soft-mode frequencies reveal strong bend-stretch coupling in the complex. Excellent agreement (within 0.3 cm−1) is found between experiment and prediction from Hutson's H6(4, 3, 2) potential [J. Chem. Phys. 99, 9337 (1993)], for the three new levels. Large basis set coupled cluster calculations [CCSD(T)] of the Ar–HF intermolecular potential surface, V(R,θ,r), are presented for r=0.6–2.0 Å and θ=0–180° on a grid with 15° spacing. This is an enlargement of the HF valence coordinate of more than double the equilibrium value. The dependence of the intermolecular potential upon the HF valence coordinate, r, is very anisotropic, being maximal for θ=0° and becoming essentially independent of r for θ≥45°. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 73 (2002), S. 1994-1997 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have developed a simple, compact, high power, diode-pumped, intracavity frequency-doubled, Nd:Y3Al5O12 laser capable of generating output powers of up to 70 W at 10 kHz, and 16.5 W at 1 kHz. The output beam quality is highly multimode, with an M2∼30. This, combined with the short output pulse duration of 36–60 ns, and the high average power, makes this laser ideal for pumping ultrafast Ti:sapphire laser amplifier systems. © 2002 American Institute of Physics.
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 1589-1594 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A prototype autocorrelator device for measuring the pulse width of ultrashort laser pulses in the picosecond and femtosecond regimes has been constructed. The device is based on multiphoton induced ionization of electrons from a charged metal surface mounted on a vibrating silica fiber, which is an entirely different physical principle from those employed by existing methods for ultrashort pulse characterization, e.g., streak cameras or second harmonic generation. The new method distinguishes itself from existing techniques in that it is, in principle, applicable to a very wide range of wavelengths, from the far ultraviolet to the infrared, requires no special optical orientation of a nonlinear crystal, and can be used for both femtosecond and picosecond pulses. The prototype device has been successfully applied to 532 nm laser pulses with a ∼20 ps pulse width, and preliminary work shows it is applicable to femtosecond pulses as well © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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