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  • American Institute of Physics (AIP)  (22)
  • 2000-2004  (10)
  • 1995-1999  (12)
  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Physics of Plasmas 9 (2002), S. 748-751 
    ISSN: 1089-7674
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A new suppression mechanism of turbulent transport, characteristic of the synergism between safety factor and shear flows, is proposed to explain the internal transport barriers (ITBs) observed in neutral-beam-heated tokamak discharges with reversed magnetic shear. It is shown that the evolution of turbulent transport with the strength of the suppression mechanism reproduces the basic features of the formation and development of ITBs observed in experiments. In addition, the present analyses predict the possibility of global ion and electron heat transport barriers. © 2002 American Institute of Physics.
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Physics of Plasmas 5 (1998), S. 959-965 
    ISSN: 1089-7674
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The sheared slab ηi instability is reconsidered in tokamak plasma with negative magnetic shear. A modified sheared slab model is presented to include both the magnetic shear and its variation with the magnetic surface. The results show that the slow variation of magnetic shear can aggravate the sheared slab ηi instability in the region near the minimum-q magnetic surface and that it has a weak stabilizing role in the plasma core near the axis. However, when the effect of the variation of magnetic shear increases, it can give rise to a stronger slab ηi instability. In addition, a linear mode coupling mechanism could be mediated by the variation of magnetic shear with a magnetic surface. © 1998 American Institute of Physics.
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Physics of Plasmas 6 (1999), S. 1034-1037 
    ISSN: 1089-7674
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Stability of the sheared slab ηi mode at the tokamak internal transport barrier (ITB) off and near the minimum-q magnetic surface is studied under the assumption that the profile of the perpendicular rotation velocity has a Gaussian distribution. The results show that the effects of the perpendicular velocity profile with shear and curvature depend on the regimes with finite or weak magnetic shear where the ITB is located; on the rotation direction along the ion or electron diamagnetic drift; and on the mode structure of the eigen perturbation. The stabilizing or destabilizing roles of the perpendicular velocity shear and curvature are numerically analyzed in detail. © 1999 American Institute of Physics.
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 2641-2648 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Epitaxial growth of CoSi2 by solid state reaction of Co/a-Si/Ti/Si(100) is investigated. A Ti/a-Si composite interlayer is used to modify the diffusion barrier and influence the epitaxial growth process. The epitaxial quality of the CoSi2 is improved compared to the film grown by Co/Ti/Si reaction. A multielement amorphous layer is formed by a solid-state amorphization reaction at the initial stage of the multilayer reaction. This layer acts as a diffusion barrier, which controls the atomic interdiffusion of Co and Si while limiting the supply of Co atoms. CoSi2 grows as the first phase and the growth interface of the epitaxial CoSi2 is at both the CoSi2/Si and CoSi2/CoSi interfaces. Investigation of the growth kinetics shows that the activation energy of CoSi2 formation is larger than that without an amorphous Si layer. © 2001 American Institute of Physics.
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 8498-8502 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The effects of high temperature rapid thermal annealing (HT-RTA) using a flat gas flame on the electrical properties of phosphorus-doped polycrystalline silicon (poly-Si) films in association with their microscopic structure were studied. Samples with a phosphorus concentration of 3.1×1017–6.0×1020 cm−3 were prepared and annealed by HT-RTA ranging from 1150 to 1350 °C. During HT-RTA, the sample surface was laterally swept by gas flames. The resistivity of the samples decreased with increasing annealing temperature, and the lowest resistivity was 4.8×10−4 Ω cm for the sample doped with P of 6.0×1020 cm−3 when annealed at 1350 °C. Hall mobility, on the other hand, increased first and then decreased with increasing P concentration. The highest Hall mobility was 71.3 cm2/V s for the sample annealed at 1350 °C of which the P concentration was 3.5×1019 cm−3. The results suggest that the grain boundary potential barriers for carriers decreased with increasing doping concentration and annealing temperature, and that the total area of grain boundaries in the films decreased with increasing annealing temperature because of secondary grain growth and the shrinkage of boundary width. © 1996 American Institute of Physics.
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 1459-1464 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The effect of gas flame annealing on the structure of polycrystalline Si films was studied using transmission electron microscopy and electron spin resonance. This annealing technique involved heating the sample surface to more than 1100 °C using flat gas flames with a scan rate of 1 mm/s and a heating rate of about 260 °C/min. Electron microscopy images revealed that the secondary grain growth proceeded with increasing the number of annealing times (annealing frequency) and that the grain size for samples annealed at 1360 °C was more than 1 μm whereas secondary grain growth was not significant for samples annealed at 1150 °C. Further, it was found that the spin density in the samples annealed at 1360 °C decreased from 1.5×1018 cm−3 to 3.8×1017 cm−3. It was concluded from the spin resonance results and the electron microscopy images that the secondary grain growth consists of two processes, the initial structural rearrangement of the grain boundaries and the subsequent grain growth. © 1995 American Institute of Physics.
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  • 7
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 72 (1998), S. 1394-1396 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: BaTiO3/SrTiO3 multilayered thin films were deposited on Si and Pt/Si substrates. X-ray diffraction clearly shows the formation of the superstructures. Phase transition properties were studied via dielectric measurements. Glassy behavior, characterized by a strong frequency dispersion of dielectric properties, was found in samples with a total thickness of 400 nm, while in samples with a total thickness of 800 nm, normal ferroelectric phase transitions with two dielectric peaks were observed. A preliminary interpretation assumes that size effects which frustrate long range ferroelectric ordering may lead to the relaxational behavior in BaTiO3/SrTiO3 superstructures. © 1998 American Institute of Physics.
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  • 8
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 70 (1997), S. 3029-3031 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Thin films (∼0.43 and ∼0.95 μm thick) of YBa2Cu3O7−δ on (100) LaAlO3 substrates have been implanted with 800 keV Ag+ to a dose of 5×1014/cm2, at room temperature (i.e., the total range (approximate)0.4 μm and the damage level (approximate)3.1 displacements per atom) and at elevated temperatures (450, 650, and 780 °C), followed by an in situ annealing schedule in flowing oxygen ambient. We have found that the implantation at room temperature amorphizes the implanted layer. In such a case, the implanted layer cannot regrow to the superconducting phase if there is no crystal seed remaining in the bottom of the film, whereas implantation at elevated temperatures plus an in situ annealing schedule, including a step at 870 °C in flowing oxygen ambient, can maintain the crystal structure and superconductivity of the films. For the thicker film, we have found that after the implantation at 450 or 650 °C and the in situ annealing, the total volume of the film has recovered to the superconducting 123 phase with a Tc=89 K. © 1997 American Institute of Physics.
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  • 9
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 82 (1997), S. 1236-1241 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Calculations of the binding energy of an on-center donor hydrogenic impurity in a quasizero-dimensional quantum-well system [quantum dot (QD)] placed in an intense, high-frequency laser field are presented. A nonperturbative theory and a variational approach are used as the framework for this calculation. The effect of the intense laser field is to "dress" the impurity potential making it dependent upon the laser field amplitude. A rapid decrease of the binding energy, for different values of the QD radius and for both infinite and finite potential barriers, with increasing field intensity is predicted. An application is made for a spherical QD made of GaAs/Ga1−xAlxAs heterostructures. © 1997 American Institute of Physics.
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  • 10
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 1235-1244 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A pulsed excimer laser was used to evaporate targets of boron nitride and titanium nitride in an attempt to produce hard thin films on crystalline silicon substrates. The films were either pure TiN or BN layers, as well as alternating multilayers and mixed layers. Deposition could be assisted by ion bombardment. The films were characterized by Auger electron spectroscopy, Fourier transform infrared spectroscopy (FTIR), and x-ray diffraction. A selection of films was also studied by profilometry in order to determine deposition rate and the type of stress present. The level of stress in TiN films was also a function of the deposition temperature and could be varied with the use of ion bombardment. Amorphous, cubic, and hexagonal BN films were produced and the effect of the stress of the substrate on these layers was investigated. Multilayers were stressed, having alternating layers of nanocrystalline TiN and amorphous BN. Mixtures consisted of nanometer-sized regions of crystalline TiN and sp2 coordinated boron nitride. FTIR spectra and high-resolution transmission electron microscope pictures suggested that in the mixtures, boron nitride planes tended to parallel the surface of the TiN grains. No sign of stress-driven formation of cubic BN was observed in the multilayers nor in the nanosized mixtures, regardless of the stress level present in them; neither was there any sign of titanium borides or other structures that might increase the hardness of the films. © 2000 American Institute of Physics.
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