Publication Date:
2019-07-13
Description:
SiGe HBT heavy ion current transients are measured using microbeam and both high- and low-energy broadbeam sources. These new data provide detailed insight into the effects of ion range, LET, and strike location.
Keywords:
Electronics and Electrical Engineering
Type:
IACRO 09-45871
,
DE-AC04-94AL85000
,
Nuclear and Space Radiation Effects Conference; Jul 20, 2009 - Jul 24, 2009; Quebec City, Quebec; Canada
Format:
application/pdf
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