ISSN:
0142-2421
Keywords:
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
Surface concentrations and sputtered-off atom concentrations of α brass are measured during ion bombardment, respectively by Auger spectroscopy and by a new quantitative sputtered thermal ion mass spectrometry method. A new formulation of the problem of surface composition change is proposed which leads to a definition of matrix effect coefficients, sputter elemental yields and a sputter correction factor μ, connecting surface concentrations to sputtered-off atom concentrations. Implications in quantitative analysis by Auger spectroscopy or any mass spectrometry technique are discussed.
Additional Material:
9 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/sia.740070306
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