Publication Date:
2019-07-13
Description:
Susceptibility of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects is studied. Devices tested include digital, linear bipolar, and hybrid devices.
Keywords:
Electronics and Electrical Engineering
Type:
2006 IEEE Nuclear and Space Radiation Effects Conference; Jul 17, 2006 - Jul 21, 2006; Ponte Vedra, FL; United States
Format:
application/pdf
Permalink