ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
Measurements of anomalous small-angle X-ray scattering often include a strong fluorescent background. The separation of the elastic scattering from the background is usually performed at the time of analysis. This paper presents an alternative experimental method using a multilayer analyser compatible with a linear position-sensitive detector and, for a test case, compares the resulting structure factors with those obtained by the usual technique. The technique achieves the proposed goal but at the expense of counting rate.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0021889892007064
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