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  • Articles  (91)
  • American Institute of Physics (AIP)
  • Cambridge University Press
  • 2005-2009  (22)
  • 1990-1994  (69)
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  • 11
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 56 (1990), S. 1760-1762 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Intentional carbon doping of low-pressure metalorganic chemical vapor deposition (MOCVD) grown InP has been attempted with a 500 ppm mixture of 13CCl4 in high-purity H2, which has been used to obtain carbon-acceptor concentrations as high as 1×1019 cm−3 in GaAs. Under growth conditions similar to those used for heavy carbon incorporation in GaAs, injection of 13CCl4 into the growth reactor during growth of InP did not produce any measurable change in the carrier concentration of the InP epitaxial layers or any change in the 13C concentration above the 13C background in secondary-ion mass spectroscopy analysis. These results support previous low-temperature photoluminescence measurements of high-purity InP in which no residual carbon acceptor is observed under many growth techniques and growth conditions, and hence support the hypothesis that carbon is not incorporated in InP grown by MOCVD.
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  • 12
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 56 (1990), S. 836-838 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A dilute mixture of CCl4 in H2 has recently been shown to be a suitable carbon doping source for obtaining p-type GaAs grown by metalorganic chemical vapor deposition (MOCVD) with carbon acceptor concentrations in excess of 1×1019 cm−3. To understand the effect of growth parameters on carbon incorporation in CCl4-doped AlxGa1−xAs, carbon acceptor concentration was studied as a function of Al composition, growth temperature, growth rate, and CCl4 flow rate using electrochemical capacitance-voltage profiling. The carbon incorporation as a function of Al composition, growth temperature, and CCl4 flow rate was also measured by secondary-ion mass spectroscopy. All layers were grown by low-pressure MOCVD using TMGa and TMAl as column III precursors, and 100% AsH3 as the column V source. Increased Al composition reduced the dependence of carbon concentration on the growth temperature. Reduced growth rate, which resulted in substantially decreased carbon acceptor concentrations in GaAs, had an insignificant effect on the carrier concentration of Al0.4Ga0.6As. A linear relationship between hole concentration and CCl4 flow rate in AlxGa1−xAs for 0.0≤x≤0.8 was observed. These results are interpreted to indicate that adsorption and desorption of CCly (y≤3) on the AlxGa1−xAs surface during crystal growth plays an important role in the carbon incorporation mechanism.
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  • 13
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 56 (1990), S. 131-133 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report an epitaxial method for orienting thin films of polydiacetylenes on ordinary alignment polymers that have been stretched by rubbing. By selectively removing the alignment polymer using standard photolithographic techniques, we show that it is possible to obtain well-oriented polydiacetylene films in desired regions. Typical values for the birefringence are 0.14±0.01 for epitaxially grown films, enough to allow the formation of gratings and channel waveguides on patterned surfaces.
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  • 14
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Data are presented showing limited layer disordering (or intermixing) of S-diffused Se-doped or C-doped AlxGa1−xAs-GaAs superlattices. The S diffusion is characterized via secondary-ion mass spectroscopy, shallow angle beveled cross sections, and absorption measurements. Limited intermixing of column-III-site atoms (Al(arrow-right-and-left)Ga) as well as minimal displacement of the column-V-site acceptor C is observed. The S diffusion depth is much greater than that of the layer disordering, the magnitude of which is similar to that of native-defect vacancy-assisted disordering (vacancy VIII).
    Type of Medium: Electronic Resource
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  • 15
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 56 (1990), S. 241-243 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have studied the effects of ion implanting boron into glow discharge deposited hydrogenated amorphous silicon films (a-Si:H). Electrical activity more than two orders of magnitude higher than previously reported1 is measured in our samples. Implantations of Si ions are used to study the effect of post-annealing on the radiation damage. Hydrogen introduced by low-energy implantation and diffusion is found to completely recover electrical and optical characteristics in Si-implanted specimens even at the highest concentrations (1021/cm3), where annealing for 1 h at 260 °C was insufficient. Introduction of H in B-implanted samples was found to deactivate the boron, which can be reactivated by low-temperature annealing.
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  • 16
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Experiments are described employing secondary-ion mass spectroscopy (SIMS) to study the stability of 13C-doped Al0.5Ga0.5As-GaAs superlattices against Zn and Si impurity-induced layer disordering (IILD). The modulation depth of the SIMS 27Al and 13C signals is used as a sensitive probe of column III and column V sublattice interdiffusion. The data show that CAs is much more stable against Zn and Si IILD than the column III superlattice host crystal itself. The minor enhancement of CAs diffusion via the column III disordering agents, which is present to a significant extent for Si IILD but almost nonexistent for Zn IILD, suggests that there is no direct interchange of column III and column V sublattice atoms. The Zn and Si enhancement of carbon diffusion is probably caused by local Coulombic interaction between the diffusing Zn+i and Si+III species and the C−As acceptor.
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  • 17
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 56 (1990), S. 13-15 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report the fabrication of single-mode channel waveguides in spun films of polydiacetylenes using an inverted rib design. These robust guides consist of a planar layer of the polydiacetylene spun on a glass substrate in which high-index channels have been defined by ion exchange. Models of such guides show that most of the optical field of the guided wave is confined to the polymer layer, with the high-index glass channels providing lateral confinement. End-fire coupling of 1.06, 1.15, 1.32, and 1.55 μm light into the composite guides resulted in single-mode guiding with the light confined to the polymer layer. This approach to waveguide formation should be applicable to a wide range of polymeric materials.
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  • 18
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 61 (1990), S. 2211-2213 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: It is shown that using the secondary breakdown effect of a bipolar transistor, often called an avalanche transistor, the large input capacitance of a power MOSFET may be charged very quickly. A power MOSFET driven by an avalanche transistor is used to generate electrical pulses of 〉800 V into 50 Ω with rise times of approximately 3 ns. The output pulse amplitude can be varied by adjusting the drain-source voltage of the power MOSFET. The trigger delay of this circuit is approximately 5 ns, with jitter of 〈100 ps. This circuit has been used to generate pulses at a repetition rate of greater than 1 kHz.
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  • 19
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    Journal of Mathematical Physics 34 (1993), S. 1076-1094 
    ISSN: 1089-7658
    Source: AIP Digital Archive
    Topics: Mathematics , Physics
    Notes: Tensor product decompositions of the N=2 superconformal algebras are examined to determine when they are finite or multiplicity-free, using various combinatorial identities. Using similar techniques, branching rules for the winding subalgebras of the N=2 superconformal algebras are investigated.
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  • 20
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 412-416 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A cell for examining the density profile of sheared fluids at the solid-liquid interface by neutron reflectometry is presented. This cell has also proven valuable in examining near-surface bulk structures in the plane perpendicular to the shear flow using small angle neutron scattering. The shear rates can be controlled by changing the volume flow through the cell over three orders of magnitude. All components of the cell are designed to be chemically inert. A temperature-controlled environment compatible with neutron studies is also briefly described. Preliminary neutron reflectivity and small angle neutron scattering results using this cell are presented, and potential applications are discussed.
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