Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
80 (2002), S. 3253-3255
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Using imaging spectroscopy at the diffraction limit, a polarization-sensitive mode mapping allows the experimental identification of transverse electric and transverse magnetic modes for spherical microcavities. The method is applied to microspheres surface covered by CdSe quantum dots. A theoretical estimate of the minimum mode volume excited by a single, anisotropic quantum dot is given with Q/V larger than 1000 μm−3 for the parameters of the experimentally studied microcavities. © 2002 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1475364
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