ALBERT — All Library Books, journals and Electronic Records Telegrafenberg

1

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Overlapping of normal and malignant mouse cells in pure and mixed cultures (1974)

Stephenson, E.M. ; Natt, J.K. ; Stephenson, N.G.

Elsevier

In: Experimental Cell Research. 1974; 84(1-2): 95-104. Published 1974 Mar 01. doi: 10.1016/0014-4827(74)90384-x.

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Publikationsdatum: 1974-03-01

Print ISSN: 0014-4827

Digitale ISSN: 1090-2422

Thema: Biologie , Medizin

Publiziert von Elsevier

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A Direct Microfluorometric Method for Measuring Subpicomole Amounts of Nicotinamide Adenine Dinucleotide Phosphate, Glucose, and Glycogen (1998)

Nguyen, Long Thanh ; Stephenson, D.George ; Stephenson, Gabriela M.M.

Elsevier

In: Analytical Biochemistry. 1998; 259(2): 274-278. Published 1998 Jun 01. doi: 10.1006/abio.1998.2634.

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Publikationsdatum: 1998-06-01

Print ISSN: 0003-2697

Digitale ISSN: 1096-0309

Thema: Biologie , Chemie und Pharmazie

Publiziert von Elsevier

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3

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Qualitatively different cross-bridge attachments in fast and slow muscle fiber types (2009)

Galler, Stefan ; Andruchov, Oleg ; Stephenson, Gabriela M.M. ; [weitere]

Elsevier

In: Biochemical and Biophysical Research Communications. 2009; 385(1): 44-48. Published 2009 Jul 01. doi: 10.1016/j.bbrc.2009.05.017.

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Publikationsdatum: 2009-07-01

Print ISSN: 0006-291X

Digitale ISSN: 1090-2104

Thema: Biologie , Chemie und Pharmazie , Physik

Publiziert von Elsevier

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4

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Erratum: A femtojoule calorimeter using micromechanical sensors [Rev. Sci. Instrum. 65, 3793 (1994)] (1995)

Barnes, J. R. ; Stephenson, R. J. ; Woodburn, C. N. ; [weitere]

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 66 (1995), S. 3083-3083

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ISSN: 1089-7623

Quelle: AIP Digital Archive

Thema: Physik , Elektrotechnik, Elektronik, Nachrichtentechnik

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.1146429

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5

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Studies of nanoscale dynamics using coherent x rays from an x-ray free electron laser (abstract) (invited) : Papers from the 12th National Synchrotron Radiation Instrumentation Conference (2002)

Stephenson, G. Brian

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 73 (2002), S. 1367-1367

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ISSN: 1089-7623

Quelle: AIP Digital Archive

Thema: Physik , Elektrotechnik, Elektronik, Nachrichtentechnik

Notizen: This talk will describe proposed studies of atomic- and nanoscale dynamics in condensed matter which take advantage of the high coherent x-ray flux to be produced by future x-ray free-electron laser (FEL) sources, such as the Linac Coherent Light Source at Stanford. In particular, I will focus on the current status and future prospects for photon correlation spectroscopy using coherent x-rays (XPCS), and the use of the ultrashort pulse structure of the x-ray FEL to observe dynamics into the femtosecond range. © 2002 American Institute of Physics.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.1448148

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6

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Asymmetrically cut crystals as optical elements for highly collimated x-ray beams : Proceedings of the 5th international conference on synchrotron radiation instrumentation (1995)

Brauer, S. ; Stephenson, G. B. ; Sutton, M. ; [weitere]

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 66 (1995), S. 1506-1509

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ISSN: 1089-7623

Quelle: AIP Digital Archive

Thema: Physik , Elektrotechnik, Elektronik, Nachrichtentechnik

Notizen: Asymmetrically cut perfect crystals, in both the Laue and Bragg geometries, are examined as single crystal monochromators for x-ray beams that are collimated to a small fraction of the Darwin width, as is typical in experiments with coherent x rays. Both the Laue and asymmetric Bragg geometries are plagued by an inherent chromatic aberration that increases the beam divergence much beyond that of the symmetric Bragg geometry. Measurements from a recent experiment at the ESRF are presented to compare Si(220) (symmetric Bragg), diamond(111) (asymmetric Laue), and diamond(111) (symmetric Bragg inclined) geometries. © 1995 American Institute of Physics.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.1145892

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Scanning tunneling microscope investigation of the growth morphology of titanium silicide on Si(111) substrates (1995)

Stephenson, A. W. ; Welland, M. E.

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 78 (1995), S. 5143-5154

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ISSN: 1089-7550

Quelle: AIP Digital Archive

Thema: Physik

Notizen: A scanning tunneling microscope in ultrahigh vacuum has been used to investigate the growth, morphology, and surface atomic structure of ultrathin titanium silicide films on Si(111) substrates. Microstructural considerations have been used to identify various stages of the silicide growth. Atomic resolution images of a titanium silicide crystallite facet, formed at 850 °C, have been identified as a 2×2 silicon termination of a C54-TiSi2(010) surface. Possible epitaxial silicide/silicon relationships are provided. Theoretical consideration has been given to the interatomic bonding in the C54-TiSi2 lattice and the dangling bond density of ideally terminated silicide planes has been calculated. The highly reconstructed atomically flat surface of a large crystallite, formed at 1200 °C, has been assigned as a C54-TiSi2(311) plane giving the epitaxial relation C54-TiSi2(311)(parallel)Si(111). The presence of pairs and linear chains of defects, with common orientations, is attributed to the decomposition of a diatomic gas on the facet, producing sites of preferential adsorption on the silicide surface. © 1995 American Institute of Physics.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.359747

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8

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Scanning tunneling microscope crystallography of titanium silicide on Si(100) substrates (1995)

Stephenson, A. W. ; Welland, M. E.

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 77 (1995), S. 563-571

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ISSN: 1089-7550

Quelle: AIP Digital Archive

Thema: Physik

Notizen: A scanning tunneling microscope (STM) in ultrahigh vacuum has been used to investigate the growth, morphology, and surface atomic structure of ultrathin titanium silicide films on Si(100) substrates. Microstructural considerations have been used to identify various stages of the silicide growth. Methods for STM crystallography have been developed and used to identify possible epitaxial silicide/silicon relationships based on morphological considerations. Atomic resolution images of a titanium silicide crystallite have identified a 2×2 silicon termination of a C54-TiSi2(111) surface. It is shown that unambiguous identification of epitaxial relationships requires images of the atomic structure of the silicide crystallite surfaces in addition to morphological information. © 1995 American Institute of Physics.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.359040

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9

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Observation of growth modes during metal-organic chemical vapor deposition of GaN (1999)

Stephenson, G. B. ; Eastman, J. A. ; Thompson, C. ; [weitere]

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 74 (1999), S. 3326-3328

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ISSN: 1077-3118

Quelle: AIP Digital Archive

Thema: Physik

Notizen: We present real-time surface x-ray scattering measurements during homoepitaxial growth of GaN by metal-organic chemical vapor deposition. We observed intensity oscillations corresponding to the completion of each monolayer during layer-by-layer growth. The growth rate was found to be temperature independent and Ga-transport limited. Transitions between step-flow, layer-by-layer, and three-dimensional growth modes were determined as a function of temperature and growth rate. © 1999 American Institute of Physics.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.123333

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10

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A normal force distance regulation scheme for near-field optical microscopy (1996)

Stephenson, R. J. ; Welland, M. E.

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 68 (1996), S. 1607-1609

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ISSN: 1077-3118

Quelle: AIP Digital Archive

Thema: Physik

Notizen: A near-field optical microscope (NFOM) has been developed that combines the features of a near-field optical microscope and an atomic force microscope. Improved control over tip-sample separation has led to improved optical imaging and independent surface topography information. The tip oscillation is normal to the sample plane thereby reducing lateral forces—important for nonperturbative imaging of soft samples. Both topographic images and reflection near-field optical images are presented which demonstrate the capability of the system. © 1996 American Institute of Physics.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.115666

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