Publication Date:
2014-10-14
Description:
Author(s): O. Romanyuk, K. Hattori, M. Someta, and H. Daimon The surface structure of epitaxial β-FeSi2(100) thin film grown on Si(001) was analyzed using the quantitative low-energy electron diffraction intensity-voltage (LEED I-V) method, ab initio density functional theory (DFT) calculations, and scanning tunneling microscopy (STM). LEED patterns measured ... [Phys. Rev. B 90, 155305] Published Mon Oct 13, 2014
Keywords:
Semiconductors II: surfaces, interfaces, microstructures, and related topics
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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