Publication Date:
2014-11-15
Description:
Author(s): M.-Y. Xie, M. Schubert, J. Lu, P. O. Å. Persson, V. Stanishev, C. L. Hsiao, L. C. Chen, W. J. Schaff, and V. Darakchieva We develop and discuss appropriate methods based on x-ray diffraction and generalized infrared spectroscopic ellipsometry to identify wurtizte and zinc-blende polymorphs, and quantify their volume fractions in mixed-phase epitaxial films taking InN as an example. The spectral signatures occurring in... [Phys. Rev. B 90, 195306] Published Fri Nov 14, 2014
Keywords:
Semiconductors II: surfaces, interfaces, microstructures, and related topics
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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