Publikationsdatum:
2011-07-19
Beschreibung:
Author(s): Knut Müller, Marco Schowalter, Andreas Rosenauer, Dongzhi Hu, Daniel M. Schaadt, Michael Hetterich, Philippe Gilet, Oleg Rubel, Rafael Fritz, and Kerstin Volz A transmission electron microscopy (TEM) method for simultaneous measurement of indium and nitrogen content in InGaNAs at atomic scale is introduced, tested, and applied to investigate thermal annealing effects on structural properties. Our technique is based on the extraction of strain and chemical... [Phys. Rev. B 84, 045316] Published Mon Jul 18, 2011
Schlagwort(e):
Semiconductors II: surfaces, interfaces, microstructures, and related topics
Print ISSN:
1098-0121
Digitale ISSN:
1095-3795
Thema:
Physik
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