Keywords:
coordinate measuring machine
;
structural design
;
contact or noncontact probe
;
micro/nano-CMM
;
error compensation
;
measuring path
;
free-form measurement
Description / Table of Contents:
Coordinate measuring machines (CMMs) have been conventionally used in industry for 3D-dimensional and form-error measurements of macro parts for many years. Ever since the first CMM, developed by Ferranti Co. in late 1950s, they have been regarded as versatile measuring equipment, yet many CMMs on the market still have inherent systematic errors due to the violation of the Abbe Principle in the design aspect. Current CMMs are suitable only for part tolerance above 10 μm. With the rapid advent of ultraprecision technology, multi-axis machining, and micro/nanotechnology in the past twenty years, new types of ultraprecision and micro/nao-CMMs are urgently needed in all aspects of society.
Pages:
Online-Ressource (XII, 198 Seiten)
Edition:
Printed Edition of the Special Issue Published in Applied Sciences
ISBN:
9783038422778
URL:
http://www.mdpi.com/books/pdfview/book/233
Language:
English
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