Publication Date:
2015-12-10
Description:
Author(s): Meliha G. Rainville, Christa Wagenbach, Jeffrey G. Ulbrandt, Suresh Narayanan, Alec R. Sandy, Hua Zhou, Randall L. Headrick, and Karl F. Ludwig, Jr. Detailed quantitative measurement of surface dynamics during thin film growth is a major experimental challenge. Here x-ray photon correlation spectroscopy with coherent hard x rays is used in a grazing-incidence small-angle x-ray scattering (i.e., Co-GISAXS) geometry as a tool to investigate nanosc… [Phys. Rev. B 92, 214102] Published Tue Dec 08, 2015
Keywords:
Structure, structural phase transitions, mechanical properties, defects
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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