Publication Date:
2019-07-27
Description:
The components of the calibration facility at the University of Colorado are described. The system is capable of analyzing the performance of optical components in the wavelength range from 2.7 to 2500 A. The system uses two light sources: a water-cooled hollow cathode gas discharge source and a soft X-ray source. The 2.2-m grazing incidence monochrometer, slits, large chamber, and computer-controlled manipulator are examined. The NBS aluminum oxide photodiode, a flowing gas proportional counter, and an imaging microchannel plate device are employed to detect the light. The optics, detectors, and data acquisition system are computer controlled. The facility is applicable for evaluating the performance of diffraction gratings, multilayer mirrors, reflective coatings, spectrographs, surface roughness scattering, and absolute detector efficiencies. Examples demonstrating the capabilities of the facility and a diagram of the facility are presented.
Keywords:
INSTRUMENTATION AND PHOTOGRAPHY
Type:
X-ray calibration: Techniques, sources, and detectors; Aug. 19, 20, 1986; San Diego, C A; United States
Format:
text
Permalink