Publication Date:
2016-04-14
Description:
Author(s): Nicholas P. Butch, Johnpierre Paglione, Paul Chow, Yuming Xiao, Chris A. Marianetti, Corwin H. Booth, and Jason R. Jeffries Resonant x-ray emission spectroscopy was used to determine the pressure dependence of the f -electron occupancy in the Kondo insulator SmB 6 . Applied pressure reduces the f occupancy, but surprisingly, the material maintains a significant divalent character up to a pressure of at least 35 GPa. Thus, t… [Phys. Rev. Lett. 116, 156401] Published Wed Apr 13, 2016
Keywords:
Condensed Matter: Electronic Properties, etc.
Print ISSN:
0031-9007
Electronic ISSN:
1079-7114
Topics:
Physics
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