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  • Articles  (4)
  • American Institute of Physics (AIP)  (4)
  • Elsevier
  • Institute of Physics (IOP)
  • 2015-2019  (1)
  • 1990-1994  (3)
  • Electrical Engineering, Measurement and Control Technology  (4)
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  • Articles  (4)
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  • 1
    Electronic Resource
    Electronic Resource
    e-beam probe potential diagnostic in spherical electrostatic-inertial plasma confinement (SEIC) (abstract) : Proceedings of the 9th topical conference on high temperature plasma diagnostics (1992)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 4731-4731 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new e-beam probe is developed to study the potential structure inside a SEIC device [G. H. Miley et al., Fusion Technol. 19, 840 (1991)]. The device has a spherical grid negatively biased inside a spherical vacuum chamber. Ions oscillate through the highly transparent grid, forming a single potential well inside the cathode. The potential in turn attracts electrons from ionization of background gas. The measurement of this complex potential profile is the objective of this work. The e-beam probe offers advantages over the e-emitting probes and the laser heterodyne method. It minimizes perturbations (versus a physical probe) and detects smaller charge density variations than possible with laser techniques. The present e-beam probe utilizes a higher voltage and a modified focus compared to the earlier version used by Swanson [Swanson et al., Phys. Fluids 16, 1939 (1973)]. The characteristic e-beam deflection patterns observed are compared to predictions from an impulse approximation model.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1143622
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Potential profile measurements using a collimated proton detector in spherical inertial-electrostatic plasma confinement : Proceedings of the 9th topical conference on high temperature plasma diagnostics (1992)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 4810-4812 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A collimated proton detector has been developed for spatial resolved proton measurements in inertial-electrostatic plasma confinement (IEC) fusion experiments. These are the first proton measurements used to infer potential well profiles on an IEC device. This paper describes a new technique for investigating the existence of multiple potential wells inside IEC devices. Analysis of the observed proton energy and source profile indicates that (for a 12-mA cathode current, a 30-kV cathode voltage in a 4-mTorr D2 background) predominantly beam-background fusion occurs. Computer simulation suggests that a positive space charge potential approximately half that of the applied voltage is formed inside the cathode. These results establish the first measurement of a positive potential well structure inside an ion-injected IEC device.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1143844
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Biased probe for plasma diagnostics in spherical electrostatic inertial plasma confinement : Eight topical conference on high−temperature plasma diagnostics (1990)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 61 (1990), S. 2902-2904 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The biased probe, as a unique extension of the Langmuir probe, offers several advantages in measuring the charged-particle flux versus position in a beam-dominated plasma such as encountered in the spherical electrostatic inertial confinement (SEIC) device. The probe operates in a non-Maxwellian and locally non-neutral plasma, where the Debye length is large compared to the probe itself. Its conical particle acceptance extension minimizes the measurement error caused by the distortion of the SEIC potential structures. Either the ion or electron flux can be measured using the proper bias on its inner collecting element.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1141768
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  • 4
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    Improved spatial calibration for the CXRS system on EAST (2016)
    American Institute of Physics (AIP)
    Details
    Publication Date: 2016-09-02
    Description: A Charge eXchange Recombination Spectroscopy (CXRS) diagnostic system has been developed to measure profiles of ion temperature and rotation since 2014 on EAST. Several techniques have been developed to improve the spatial calibration of the CXRS diagnostic. The sightline location was obtained by measuring the coordinates of three points on each sightline using an articulated flexible coordinate measuring arm when the vessel was accessible. After vacuum pumping, the effect of pressure change in the vacuum vessel was evaluated by observing the movement of the light spot from back-illuminated sightlines on the first wall using the newly developed articulated inspection arm. In addition, the rotation of the periscope after vacuum pumping was derived by using the Doppler shift of neutral beam emission spectra without magnetic field. Combining these techniques, improved spatial calibration was implemented to provide a complete and accurate description of the EAST CXRS system. Due to the effects of the change of air pressure, a ∼0.4° periscope rotation, yielding a ∼20 mm movement of the major radius of observation positions to the lower field side, was derived. Results of Zeeman splitting of neutral beam emission spectra with magnetic field also showed good agreement with the calibration results.
    Print ISSN: 0034-6748
    Electronic ISSN: 1089-7623
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Published by American Institute of Physics (AIP)
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