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  • Functional differential equations  (1)
  • design validation  (1)
  • methods  (1)
  • 2015-2019
  • 1995-1999  (3)
  • 1970-1974
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  • 2015-2019
  • 1995-1999  (3)
  • 1970-1974
Year
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    International journal of anthropology 10 (1995), S. 229-239 
    ISSN: 1824-3096
    Keywords: Interobserver error ; methods ; skeletal aging
    Source: Springer Online Journal Archives 1860-2000
    Topics: Biology
    Notes: Abstract This research evaluates the interobserver error when the macroscopic methods recommended by American and European anthropologists to estimate age at death of a skeleton, were applied to a sample of the Terry Collection (Smithsonian Institution, Washington D.C.). Although no statistical differences among observers were found for any of these methods, small dissimilarities suggest that techniques using a narrower scale of categories produce greater agreement among researchers. The present study is within a wider research project designed to evaluate the accuracy of these methods, when applied to an identified (age known) sample of 963 skeleton from the Terry Collection.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Journal of electronic testing 14 (1999), S. 133-140 
    ISSN: 1573-0727
    Keywords: design validation ; mutation testing ; VHDL
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Abstract In this paper we propose a new approach that addresses both the problems of design validation and hardware testing since the early stages of the design flow. The approach consists in adapting the mutation testing, a software method, to circuits described in VHDL. At the functional level, the approach behaves as a design validation method and at the hardware level as a classical ATPG. Standard software test metrics are used for assessing the quality of the design validation process, and the hardware fault coverage for assessing the test quality at the hardware level. An enhancement process that allows design validation to be efficiently reused for hardware testing is detailed. The approach is shown to be efficient upon a set of representative circuits.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Springer
    Journal of optimization theory and applications 88 (1996), S. 433-451 
    ISSN: 1573-2878
    Keywords: Functional differential equations ; dynamic economic models ; fixed-point theorem
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mathematics
    Notes: Abstract The Scheinkman-Weiss model and later works by Conze-Lasry-Scheinkman provide insights on cycles and correlations of economies with incomplete markets, namely with borrowing constraints. This work gives a mathematical solution in the case of high relative risk aversion, which has not yet been solved. The existence of an equilibrium results from the solution of a system of nonlinear functional differential equations. High risk aversion leads to new mathematical difficulties, not present in previous papers on this subject.
    Type of Medium: Electronic Resource
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