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  • Articles  (5)
  • American Institute of Physics (AIP)  (4)
  • Springer Nature  (1)
  • Cell Press
  • Oxford University Press
  • 2015-2019  (3)
  • 2000-2004  (2)
  • Electrical Engineering, Measurement and Control Technology  (5)
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  • Articles  (5)
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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 3178-3183 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The design and operation of a gas aggregation source is described. The source combines the attributes of high-temperature operation (enabling preparation of transition metal clusters), mass selection, ultrahigh vacuum compatibility, and transportability. This makes it ideally suited to in situ studies such as scanning tunneling microscope or synchrotron radiation experiments. Data are presented to illustrate the performance of the source; recent results obtained in synchrotron radiation studies are highlighted. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 4119-4126 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The design, construction and operation of a tomographic imaging system on the Compact Toroid Injection Experiment is described. The system measures the total radiated power over energies from visible light up into the extreme ultraviolet. It then reconstructs two dimensional profiles from the data. The reconstruction routine is based on a method known as second order regularization which finds a compromise between smoothness and fit to the data. This method was found to have the best overall fidelity to test images. The hardware and overall reconstruction were calibrated using two different sources. First results from the system under real experimental conditions are presented. © 2000 American Institute of Physics.
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  • 3
    Publication Date: 2015-04-14
    Description: We present a miniaturized molecular beam epitaxy (miniMBE) system with an outer diameter of 206 mm, optimized for flexible and high-throughput operation. The three-chamber system, used here for oxide growth, consists of a sample loading chamber, a storage chamber, and a growth chamber. The growth chamber is equipped with eight identical effusion cell ports with linear shutters, one larger port for either a multi-pocket electron beam evaporator or an oxygen plasma source, an integrated cryoshroud, retractable beam-flux monitor or quartz-crystal microbalance, reflection high energy electron diffraction, substrate manipulator, main shutter, and quadrupole mass spectrometer. The system can be combined with ultrahigh vacuum (UHV) end stations on synchrotron and neutron beamlines, or equivalently with other complex surface analysis systems, including low-temperature scanning probe microscopy systems. Substrate handling is compatible with most UHV surface characterization systems, as the miniMBE can accommodate standard surface science sample holders. We introduce the design of the system, and its specific capabilities and operational parameters, and we demonstrate the epitaxial thin film growth of magnetoelectric Cr 2 O 3 on c -plane sapphire and ferrimagnetic Fe 3 O 4 on MgO (001).
    Print ISSN: 0034-6748
    Electronic ISSN: 1089-7623
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
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  • 4
    Publication Date: 2016-05-26
    Description: X-ray mirror quality has continuously improved over the past 20 years and manufacturers are now able to provide long mirrors with slope errors below 0.2 μ rad. Nevertheless, these mirrors are mounted on holders or even mechanical benders to adjust their curvature and their intrinsic quality must be preserved from any parasitic deformation such as twist. The most direct method of detecting these deformations is to measure the 3D topography of the optical surface. At the ESRF metrology laboratory, three different stitching systems are under development based on Fizeau sub-aperture measurements. The first one consists of measuring long flat mirrors, the second based on the relative angle determinable stitching interferometry (RADSI) method developed at SPring-8 is aimed primarily at the measurement of short mirrors with strong curvature down to a few meters, and the last, also based on the RADSI method, is dedicated to characterize longer mirrors with intermediate curvature. For each method we will describe the measurement setup and discuss first results obtained. Micro-stitching interferometry is also currently used at the ESRF metrology laboratory. The technique is suitable for measuring deeply curved aspherical profiles and will be illustrated with results from a Kirkpatrick-Baez mirror system for nano-focusing.
    Print ISSN: 0034-6748
    Electronic ISSN: 1089-7623
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
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  • 5
    Publication Date: 2017-12-01
    Print ISSN: 2096-1030
    Electronic ISSN: 2055-7434
    Topics: Electrical Engineering, Measurement and Control Technology , Energy, Environment Protection, Nuclear Power Engineering , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Published by Springer Nature
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