Publication Date:
2017-02-14
Description:
Author(s): M. Shaviv Petrushevsky, P. K. Rout, G. Levi, A. Kohn, and Y. Dagan The temperature and thickness dependencies of the in-plane anisotropic magnetoresistance (AMR) of SmB 6 thin films are reported. We find that the AMR changes sign from negative ( ρ | | 〈 ρ ⊥ ) at high temperatures to positive ( ρ | | 〉 ρ ⊥ ) at low temperatures. The temperature, T s , at which this sign change… [Phys. Rev. B 95, 085112] Published Thu Feb 09, 2017
Keywords:
Electronic structure and strongly correlated systems
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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