ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A simple technique of single shot x-ray microscopic imaging is reported using two simultaneously produced laser-plasma x-ray sources. Twin x-ray images are recorded by placing the sample in a proximity gap with a photoresist and exposing it to two equivalent point x-ray sources. Characterization of the technique is carried out using a carbon fiber as a test sample and x-ray emission (hν≥1 keV) from laser produced copper plasmas. A spatial resolution of ∼300 nm is observed, consistent with the geometrical parameters of the imaging system. This method may be useful in obtaining a single shot comparison of spectral and temporal characteristics of a sample by using different x-ray filters or plasma targets for the two imaging paths and a temporal delay in generation of the two x-ray sources, respectively. © 2001 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1340757
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