ALBERT

All Library Books, journals and Electronic Records Telegrafenberg

feed icon rss

Ihre E-Mail wurde erfolgreich gesendet. Bitte prüfen Sie Ihren Maileingang.

Leider ist ein Fehler beim E-Mail-Versand aufgetreten. Bitte versuchen Sie es erneut.

Vorgang fortführen?

Exportieren
Filter
  • Institute of Physics (IOP)  (1)
  • National Academy of Sciences
  • 2015-2019  (1)
  • 2016  (1)
Sammlung
Erscheinungszeitraum
  • 2015-2019  (1)
Jahr
  • 1
    Publikationsdatum: 2016-09-03
    Beschreibung: The microelectronic industry has been growing rapidly over the past 10-20 years, as has its reliance on thin-film deposition techniques for components manufacturing. As modern devices generate quite a bit of heat and peak temperatures can reach over 100°C, there is a need to provide adequate cooling for a device to stay operable. A series of chrome gold films with various thicknesses were prepared on silicon substrate. The structural and surface morphology, adhesion, friction, Young's modulus and hardness of this thin film were studied for three different thicknesses under temperature variations between 20 to 100°C. The variation of the film thickness and temperature affects the structure, surface and mechanical properties of Cr/Au thin films. Obviously these thermal cycles are unavoidable and eventually lead to thermal fatigue damage and device failure. Consequently, the knowledge of mechanical properties of thin films at elevated temperatures is required for proper chip design...
    Print ISSN: 1757-8981
    Digitale ISSN: 1757-899X
    Thema: Maschinenbau
    Standort Signatur Erwartet Verfügbarkeit
    BibTip Andere fanden auch interessant ...
Schließen ⊗
Diese Webseite nutzt Cookies und das Analyse-Tool Matomo. Weitere Informationen finden Sie hier...