Publication Date:
2003-01-01
Description:
In this paper EXAFS was used to determine bond lengths in the structures of zeunerite and meta-zeunerite. The atomic distances between heavy and light scatterers observed using EXAFS in meta-zeunerite deviate approximately 0.1 Å from literature data of single-crystal X-ray diffraction measurements. Because this difference is significant higher than the error limits of EXAFS measurements, the complete crystal structure of meta-zeunerite, Cu[UO
Print ISSN:
2194-4946
Electronic ISSN:
2196-7105
Topics:
Geosciences
,
Physics
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