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  • Articles  (4)
  • 2015-2019
  • 2005-2009
  • 2000-2004  (4)
  • 1980-1984
  • 2000  (4)
  • Computer Science  (2)
  • Electrical Engineering, Measurement and Control Technology  (2)
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  • Articles  (4)
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  • 2015-2019
  • 2005-2009
  • 2000-2004  (4)
  • 1980-1984
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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Journal of intelligent information systems 14 (2000), S. 131-154 
    ISSN: 1573-7675
    Keywords: content-based access of images ; image representation ; intelligent information retrieval ; knowledge representation ; image databases ; query containment ; description logics ; intentional reasoning
    Source: Springer Online Journal Archives 1860-2000
    Topics: Computer Science
    Notes: Abstract The problem of content management of multimedia data types (e.g., image, video, graphics) is becoming increasingly important with the development of advanced multimedia applications. Traditional database management systems are inadequate for the handling of such data types. They require new techniques for query formulation, retrieval, evaluation, and navigation. In this paper we develop a knowledge-based framework for modeling and retrieving image data by content. To represent the various aspects of an image object's characteristics, we propose a model which consists of three layers: (1) Feature & Content Layer, intended to contain image visual features such as contours, shapes, etc.; (2) Object Layer, which provides the (conceptual) content dimension of images; and (3) Schema Layer, which contains the structured abstractions of images, i.e., a general schema about the classes of objects represented in the object layer. We propose two abstract languages on the basis of description logics: one for describing knowledge of the object and schema layers, and the other, more expressive, for making queries. Queries can refer to the form dimension (i.e., information of the Feature & Content Layer) or to the content dimension (i.e., information of the Object Layer). These languages employ a variable free notation. As the amount of information contained in the previous layers may be huge and operations performed at the Feature & Content Layer are time-consuming, resorting to the use of materialized views to process and optimize queries may be extremely useful. For that, we propose a formal framework for testing containment of a query in a view expressed in our query language.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Journal of electronic testing 16 (2000), S. 487-498 
    ISSN: 1573-0727
    Keywords: multi-port memories ; single-port memories ; fault models ; address decoder faults ; march tests ; fault coverage ; read-only ports ; write-only ports
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Abstract A two-port memory contains two duplicated sets of address decoders, which operate independently. Testing such memories requires the use of single-port tests as well as special two-port tests; the test strategy determines which tests have to be used. Many two-port memories have ports which are read-only or write-only; this impacts the possible tests for single-port and two-port memories, as well as the test strategy. In this paper the effects of interference and shorts between the address decoders of the two ports on the fault modeling are investigated. Fault models and their tests are introduced. In addition, the consequences of the port restrictions (read-only or write-only ports) on the fault models and tests are discussed, together with the test strategy.
    Type of Medium: Electronic Resource
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  • 3
    Publication Date: 2000-01-01
    Print ISSN: 0031-3203
    Electronic ISSN: 1873-5142
    Topics: Computer Science
    Published by Elsevier
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  • 4
    Publication Date: 2000-11-22
    Print ISSN: 0953-2048
    Electronic ISSN: 1361-6668
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Published by Institute of Physics
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