Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
70 (1999), S. 3227-3232
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
We have developed a design method to produce laterally graded multilayer x-ray mirrors based on sputter deposition techniques. The optimization of all relevant parameters yields an ab initio estimation of any layer gradient suitable to achieve precise x-ray focusing devices. The performance and the accuracy of this method are demonstrated. A graded W/B4C multilayer was deposited on a flat substrate that was bent to a parabola. The obtained nonlinear lateral gradient differed from the theoretical calculations by less than 1%. Focusing experiments performed at an x-ray energy of 8 keV on the ESRF optics beamline revealed an excellent performance with a focal spot size of about 7 μm. © 1999 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1149897
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