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  • American Institute of Physics (AIP)  (2)
  • 1995-1999  (2)
  • 1940-1944
  • 1995  (2)
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  • 1995-1999  (2)
  • 1940-1944
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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 3513-3519 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The first attempt to combine luminescence spectroscopy with scanning soft x-ray microscopy has been realized in our experiment. A new imaging luminescence spectrometer with a Schwarzschild objective was designed and built with a spectral resolution of 1.3 nm in the energy range of 1.6–6.5 eV for this purpose. Some luminescent ceramics have been investigated by using this spectrometer. A high contrast in luminescence micrographs is achieved due to the confocal arrangement of the Schwarzschild system and the microscope. The spectral and microstructural properties of these ceramics could be determined by means of luminescence microspectroscopy and spectromicroscopy. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 2021-2029 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Optical elements need to be developed at least at the same pace as synchrotron radiation sources of the third generation. We are concerned here with the interrelationship between improved optical instruments and scientific progress. This relationship becomes especially clear in the development of new monochromators with higher resolution and large throughput. The availability of better mirrors and gratings is most important in this respect. Another field is microscopy. We shall be concerned here mainly with scanning microscopy in which the radiation is imaged with mirrors onto a small spot on the sample. The respective imaging with zone plates is the topic of another paper. A spot size of 0.1 μm and better is theoretically feasible with mirrors but it depends on much progress in the manufacturing of aspherical mirrors of high accuracy. We demonstrate mainly from our own results with a spot in the 1 μm range that it is worthwhile to make this effort. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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