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Characterization of the Cottonwood Grove and Ridgely faults near Reelfoot Lake, Tennessee, from high-resolution seismic reflection data (1995)

Stephenson, William J. ; Shedlock, Kaye M. ; Odum, Jack K.

Washington, DC : United States Gov. Print. Off.

Dazugehörige Bände

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Signatur: SR 90.0002(1538-I)

In: Professional paper

Materialart: Schriftenreihen ausleihbar

Seiten: I-10 S.

Serie: U.S. Geological Survey professional paper 1538-I

Sprache: Englisch

Standort: Kompaktmagazin unten

Zweigbibliothek: GFZ Bibliothek

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Erratum: A femtojoule calorimeter using micromechanical sensors [Rev. Sci. Instrum. 65, 3793 (1994)] (1995)

Barnes, J. R. ; Stephenson, R. J. ; Woodburn, C. N. ; [weitere]

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 66 (1995), S. 3083-3083

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ISSN: 1089-7623

Quelle: AIP Digital Archive

Thema: Physik , Elektrotechnik, Elektronik, Nachrichtentechnik

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.1146429

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Studies of nanoscale dynamics using coherent x rays from an x-ray free electron laser (abstract) (invited) : Papers from the 12th National Synchrotron Radiation Instrumentation Conference (2002)

Stephenson, G. Brian

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 73 (2002), S. 1367-1367

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ISSN: 1089-7623

Quelle: AIP Digital Archive

Thema: Physik , Elektrotechnik, Elektronik, Nachrichtentechnik

Notizen: This talk will describe proposed studies of atomic- and nanoscale dynamics in condensed matter which take advantage of the high coherent x-ray flux to be produced by future x-ray free-electron laser (FEL) sources, such as the Linac Coherent Light Source at Stanford. In particular, I will focus on the current status and future prospects for photon correlation spectroscopy using coherent x-rays (XPCS), and the use of the ultrashort pulse structure of the x-ray FEL to observe dynamics into the femtosecond range. © 2002 American Institute of Physics.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.1448148

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4

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Asymmetrically cut crystals as optical elements for highly collimated x-ray beams : Proceedings of the 5th international conference on synchrotron radiation instrumentation (1995)

Brauer, S. ; Stephenson, G. B. ; Sutton, M. ; [weitere]

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 66 (1995), S. 1506-1509

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ISSN: 1089-7623

Quelle: AIP Digital Archive

Thema: Physik , Elektrotechnik, Elektronik, Nachrichtentechnik

Notizen: Asymmetrically cut perfect crystals, in both the Laue and Bragg geometries, are examined as single crystal monochromators for x-ray beams that are collimated to a small fraction of the Darwin width, as is typical in experiments with coherent x rays. Both the Laue and asymmetric Bragg geometries are plagued by an inherent chromatic aberration that increases the beam divergence much beyond that of the symmetric Bragg geometry. Measurements from a recent experiment at the ESRF are presented to compare Si(220) (symmetric Bragg), diamond(111) (asymmetric Laue), and diamond(111) (symmetric Bragg inclined) geometries. © 1995 American Institute of Physics.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.1145892

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Scanning tunneling microscope investigation of the growth morphology of titanium silicide on Si(111) substrates (1995)

Stephenson, A. W. ; Welland, M. E.

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 78 (1995), S. 5143-5154

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ISSN: 1089-7550

Quelle: AIP Digital Archive

Thema: Physik

Notizen: A scanning tunneling microscope in ultrahigh vacuum has been used to investigate the growth, morphology, and surface atomic structure of ultrathin titanium silicide films on Si(111) substrates. Microstructural considerations have been used to identify various stages of the silicide growth. Atomic resolution images of a titanium silicide crystallite facet, formed at 850 °C, have been identified as a 2×2 silicon termination of a C54-TiSi2(010) surface. Possible epitaxial silicide/silicon relationships are provided. Theoretical consideration has been given to the interatomic bonding in the C54-TiSi2 lattice and the dangling bond density of ideally terminated silicide planes has been calculated. The highly reconstructed atomically flat surface of a large crystallite, formed at 1200 °C, has been assigned as a C54-TiSi2(311) plane giving the epitaxial relation C54-TiSi2(311)(parallel)Si(111). The presence of pairs and linear chains of defects, with common orientations, is attributed to the decomposition of a diatomic gas on the facet, producing sites of preferential adsorption on the silicide surface. © 1995 American Institute of Physics.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.359747

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Scanning tunneling microscope crystallography of titanium silicide on Si(100) substrates (1995)

Stephenson, A. W. ; Welland, M. E.

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 77 (1995), S. 563-571

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ISSN: 1089-7550

Quelle: AIP Digital Archive

Thema: Physik

Notizen: A scanning tunneling microscope (STM) in ultrahigh vacuum has been used to investigate the growth, morphology, and surface atomic structure of ultrathin titanium silicide films on Si(100) substrates. Microstructural considerations have been used to identify various stages of the silicide growth. Methods for STM crystallography have been developed and used to identify possible epitaxial silicide/silicon relationships based on morphological considerations. Atomic resolution images of a titanium silicide crystallite have identified a 2×2 silicon termination of a C54-TiSi2(111) surface. It is shown that unambiguous identification of epitaxial relationships requires images of the atomic structure of the silicide crystallite surfaces in addition to morphological information. © 1995 American Institute of Physics.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.359040

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In situ x-ray diffraction analysis of the C49–C54 titanium silicide phase transformation in narrow lines (1995)

Roy, R. A. ; Clevenger, L. A. ; Cabral, C. ; [weitere]

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 66 (1995), S. 1732-1734

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ISSN: 1077-3118

Quelle: AIP Digital Archive

Thema: Physik

Notizen: The transformation of titanium silicide from the C49 to the C54 structure was studied using x-ray diffraction of samples containing arrays of narrow lines of preformed C49 TiSi2. Using a synchrotron x-ray source, diffraction patterns were collected at 1.5–2 °C intervals during sample heating at rates of 3 or 20 °C/s to temperatures of 1000–1100 °C. The results show a monotonic increase in the C54 transition temperature by as much as 180 °C with a decreasing linewidth from 1.0 to 0.1 μm. Also observed is a monotonic increase in (040) preferred orientation of the C54 phase with decreasing linewidth. The results demonstrate the power of in situ x-ray diffraction of narrow line arrays as a tool to study finite size effects in thin-film reactions. © 1995 American Institute of Physics.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.113349

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In situ x-ray scattering study of PbTiO3 chemical-vapor deposition (2002)

Murty, M. V. Ramana ; Streiffer, S. K. ; Stephenson, G. B. ; [weitere]

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 80 (2002), S. 1809-1811

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ISSN: 1077-3118

Quelle: AIP Digital Archive

Thema: Physik

Notizen: We present in situ surface x-ray scattering measurements of PbTiO3 epitaxy by metal–organic chemical-vapor deposition. Oscillations in crystal truncation rod intensity corresponding to layer-by-layer growth are observed under a variety of growth conditions. At lower PbO overpressures, we observe a transition to step-flow growth and an increased rate of recovery after growth, indicating a higher surface mobility. © 2002 American Institute of Physics.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.1458530

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Selective study of polymer/dielectric interfaces with vibrationally resonant sum frequency generation via thin-film interference (2002)

Wilson, Philip T. ; Briggman, Kimberly A. ; Wallace, William E. ; [weitere]

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 80 (2002), S. 3084-3086

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ISSN: 1077-3118

Quelle: AIP Digital Archive

Thema: Physik

Notizen: A technique for selective characterization of the structure of free and buried thin-film interfaces by vibrationally resonant sum frequency generation spectroscopy is described. Manipulation of Fresnel coefficients by choice of film thickness on a reflecting substrate allows simultaneous optimization of the signal from the desired interface and minimization of the signal from other interfacial sources. This technique is demonstrated for the free polystyrene (PS)/air and the buried PS/spin-on glass interfaces. Our spectra show that the pendant phenyl group orientation is similar at the buried and free interfaces, with the phenyls pointing away from the bulk PS at each interface.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.1475358

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Erratum: Lifetime of the CH3OH* intermediate in the reaction CH4+O(1D2)→CH3OH*→CH3+OH [J. Chem. Phys. 102, 6946 (1995)] (1995)

van Zee, Roger D. ; Stephenson, John C.

College Park, Md. : American Institute of Physics (AIP)

The Journal of Chemical Physics 103 (1995), S. 3272-3272

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ISSN: 1089-7690

Quelle: AIP Digital Archive

Thema: Physik , Chemie und Pharmazie

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.470261

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