ISSN:
1600-5724
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Chemistry and Pharmacology
,
Geosciences
,
Physics
Notes:
Recent advances describing X-ray line profiles analytically, in terms of a minimum number of parameters, are related to a theory based upon correlated dislocations. It is shown that a multiple convolution approach, based upon the Warren-Averbach (W-A) analysis, leads to a form that closely approximates the strain coefficient obtained by Krivoglaz, Martynenko & Ryaboshopka [Phys. Met. Metall. (1983), 55, 1-12]. This connection enables one to determine the dislocation density and the ratio of the correlation range parameter to the mean particle size. These two results are obtained most accurately from previous analytical approaches which make use of a statistical least-squares analysis. The W-A Fourier-series approach provides redundant information and does not focus on the critical parameters that relate to dislocation theory. Results so far are limited to b.c.c. materials. Results for cold-worked W, Mo, Nb, Cr and V are compared with highly imperfect sputtered films of Mo. A major difference is relatable to higher correlation of dislocations in cold-worked metals than is found in sputtered films deposited at low temperatures. However, in each case, the dislocation density is high.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0108767388006634
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