ISSN:
0032-3888
Keywords:
Chemistry
;
Chemical Engineering
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Chemistry and Pharmacology
,
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
The compressive stress-strain behavior of a commercial polystyrene has been studied and the effect of deformation temperature on modulus, yield stress, percent yield strain and yield energy was determined. Yield energy is the only one of these parameters that is linear with temperature in the ductile region. A change in the mode of failure from ductile to brittle occurs between 5-30°C at a strain rate of O.1/in./in./min. At all temperatures studied, the yield or fracture stress varied linearly with the rate of deformation for strain rates ranging from 0.1 to 1.0 in./in./min. The yield data as a function of temperature were analyzed via a rate expression modified to incorporate the Coulomb-Navier yield criterion, Activation energy was found to be a function of deformation temperature with a change in slope occurring near the β transition. Activation volume increased linearly with deformation temperature, for the range studied. Agreement of dynamic mechanical and yield activation energies imply that the type of motion and the height of the energy barrier are similar for both. However, an increase in activation volume for stressed vs unstressed conditions suggests that a greater number of chain segments move as a result of stress biasing. Also the increase of both activation volume and activation energy with temperature implies that the correlated length of chain movement increases as temperature is increased. Similar to activation energy, yield stress exhibits a change in temperature dependence near the β transition. Data on other glassy polymers suggest that the highest temperature sub-Tg, transition is related to the change in the temperature dependence of yield stress.
Additional Material:
10 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/pen.760181412
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