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Monographie ausleihbar

EUROPROBE: intraplate tectonics and basin dynamics of the eastern european platform : selected papers presented at the EUROPROBE ITBD workshop held in Vorzel (near Kiev), Ukraine, Oct. 1994 (1996)

Stephenson, R. A. [Hrsg.] ; Wilson, M. [Hrsg.] ; Boorder, H. de [Hrsg.]

Amsterdam : Elsevier

Dazugehörige Bände

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Signatur: ILP/M 06.0340

In: Publication of the International Lithosphere Programme

In: Tectonophysics

Materialart: Monographie ausleihbar

Seiten: x, 309 S. : graph. Darst.

Serie: [Publication of the International Lithosphere Programme] 268,1-4 : special issue

Sprache: Englisch

Standort: Lesesaal

Zweigbibliothek: GFZ Bibliothek

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Overlapping of normal and malignant mouse cells in pure and mixed cultures (1974)

Stephenson, E.M. ; Natt, J.K. ; Stephenson, N.G.

Elsevier

In: Experimental Cell Research. 1974; 84(1-2): 95-104. Published 1974 Mar 01. doi: 10.1016/0014-4827(74)90384-x.

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Publikationsdatum: 1974-03-01

Print ISSN: 0014-4827

Digitale ISSN: 1090-2422

Thema: Biologie , Medizin

Publiziert von Elsevier

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3

Digitale Medien

Erratum: A femtojoule calorimeter using micromechanical sensors [Rev. Sci. Instrum. 65, 3793 (1994)] (1995)

Barnes, J. R. ; Stephenson, R. J. ; Woodburn, C. N. ; [weitere]

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 66 (1995), S. 3083-3083

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ISSN: 1089-7623

Quelle: AIP Digital Archive

Thema: Physik , Elektrotechnik, Elektronik, Nachrichtentechnik

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.1146429

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4

Digitale Medien

Asymmetrically cut crystals as optical elements for highly collimated x-ray beams : Proceedings of the 5th international conference on synchrotron radiation instrumentation (1995)

Brauer, S. ; Stephenson, G. B. ; Sutton, M. ; [weitere]

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 66 (1995), S. 1506-1509

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ISSN: 1089-7623

Quelle: AIP Digital Archive

Thema: Physik , Elektrotechnik, Elektronik, Nachrichtentechnik

Notizen: Asymmetrically cut perfect crystals, in both the Laue and Bragg geometries, are examined as single crystal monochromators for x-ray beams that are collimated to a small fraction of the Darwin width, as is typical in experiments with coherent x rays. Both the Laue and asymmetric Bragg geometries are plagued by an inherent chromatic aberration that increases the beam divergence much beyond that of the symmetric Bragg geometry. Measurements from a recent experiment at the ESRF are presented to compare Si(220) (symmetric Bragg), diamond(111) (asymmetric Laue), and diamond(111) (symmetric Bragg inclined) geometries. © 1995 American Institute of Physics.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.1145892

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Scanning tunneling microscope investigation of the growth morphology of titanium silicide on Si(111) substrates (1995)

Stephenson, A. W. ; Welland, M. E.

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 78 (1995), S. 5143-5154

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ISSN: 1089-7550

Quelle: AIP Digital Archive

Thema: Physik

Notizen: A scanning tunneling microscope in ultrahigh vacuum has been used to investigate the growth, morphology, and surface atomic structure of ultrathin titanium silicide films on Si(111) substrates. Microstructural considerations have been used to identify various stages of the silicide growth. Atomic resolution images of a titanium silicide crystallite facet, formed at 850 °C, have been identified as a 2×2 silicon termination of a C54-TiSi2(010) surface. Possible epitaxial silicide/silicon relationships are provided. Theoretical consideration has been given to the interatomic bonding in the C54-TiSi2 lattice and the dangling bond density of ideally terminated silicide planes has been calculated. The highly reconstructed atomically flat surface of a large crystallite, formed at 1200 °C, has been assigned as a C54-TiSi2(311) plane giving the epitaxial relation C54-TiSi2(311)(parallel)Si(111). The presence of pairs and linear chains of defects, with common orientations, is attributed to the decomposition of a diatomic gas on the facet, producing sites of preferential adsorption on the silicide surface. © 1995 American Institute of Physics.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.359747

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Scanning tunneling microscope crystallography of titanium silicide on Si(100) substrates (1995)

Stephenson, A. W. ; Welland, M. E.

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 77 (1995), S. 563-571

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ISSN: 1089-7550

Quelle: AIP Digital Archive

Thema: Physik

Notizen: A scanning tunneling microscope (STM) in ultrahigh vacuum has been used to investigate the growth, morphology, and surface atomic structure of ultrathin titanium silicide films on Si(100) substrates. Microstructural considerations have been used to identify various stages of the silicide growth. Methods for STM crystallography have been developed and used to identify possible epitaxial silicide/silicon relationships based on morphological considerations. Atomic resolution images of a titanium silicide crystallite have identified a 2×2 silicon termination of a C54-TiSi2(111) surface. It is shown that unambiguous identification of epitaxial relationships requires images of the atomic structure of the silicide crystallite surfaces in addition to morphological information. © 1995 American Institute of Physics.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.359040

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Digitale Medien

A normal force distance regulation scheme for near-field optical microscopy (1996)

Stephenson, R. J. ; Welland, M. E.

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 68 (1996), S. 1607-1609

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ISSN: 1077-3118

Quelle: AIP Digital Archive

Thema: Physik

Notizen: A near-field optical microscope (NFOM) has been developed that combines the features of a near-field optical microscope and an atomic force microscope. Improved control over tip-sample separation has led to improved optical imaging and independent surface topography information. The tip oscillation is normal to the sample plane thereby reducing lateral forces—important for nonperturbative imaging of soft samples. Both topographic images and reflection near-field optical images are presented which demonstrate the capability of the system. © 1996 American Institute of Physics.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.115666

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Digitale Medien

A near-field optical microscope with normal force distance regulation (1996)

Stephenson, R. J. ; O'Shea, S. J. ; Barnes, J. R. ; [weitere]

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 67 (1996), S. 3891-3897

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ISSN: 1089-7623

Quelle: AIP Digital Archive

Thema: Physik , Elektrotechnik, Elektronik, Nachrichtentechnik

Notizen: Near-field imaging is a means of exceeding the diffraction limit in optical microscopy to yield subwavelength resolution optical images of a sample surface. In order to achieve such high resolution, it is necessary to scan the measurement probe above the surface at a height of only a few nanometers which requires careful control of the separation between tip and sample. In the implementation of the near-field optical microscope (NFOM) reported here, the distance regulation scheme is based on an inverted noncontact atomic force microscope (AFM) in which a cantilever is used as the sample substrate and imaging is performed with a fiber optic tip. In this way, both the benefits of AFM and NFOM are realized simultaneously. © 1996 American Institute of Physics.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.1147289

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9

Digitale Medien

In situ x-ray diffraction analysis of the C49–C54 titanium silicide phase transformation in narrow lines (1995)

Roy, R. A. ; Clevenger, L. A. ; Cabral, C. ; [weitere]

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 66 (1995), S. 1732-1734

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ISSN: 1077-3118

Quelle: AIP Digital Archive

Thema: Physik

Notizen: The transformation of titanium silicide from the C49 to the C54 structure was studied using x-ray diffraction of samples containing arrays of narrow lines of preformed C49 TiSi2. Using a synchrotron x-ray source, diffraction patterns were collected at 1.5–2 °C intervals during sample heating at rates of 3 or 20 °C/s to temperatures of 1000–1100 °C. The results show a monotonic increase in the C54 transition temperature by as much as 180 °C with a decreasing linewidth from 1.0 to 0.1 μm. Also observed is a monotonic increase in (040) preferred orientation of the C54 phase with decreasing linewidth. The results demonstrate the power of in situ x-ray diffraction of narrow line arrays as a tool to study finite size effects in thin-film reactions. © 1995 American Institute of Physics.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.113349

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Digitale Medien

Erratum: Lifetime of the CH3OH* intermediate in the reaction CH4+O(1D2)→CH3OH*→CH3+OH [J. Chem. Phys. 102, 6946 (1995)] (1995)

van Zee, Roger D. ; Stephenson, John C.

College Park, Md. : American Institute of Physics (AIP)

The Journal of Chemical Physics 103 (1995), S. 3272-3272

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ISSN: 1089-7690

Quelle: AIP Digital Archive

Thema: Physik , Chemie und Pharmazie

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.470261

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