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Si wafers having one- and two-dimensionally curved (111) planes examined by X-ray diffraction (2006)

Okuda, Hiroshi ; Nakajima, Kazuo ; Fujiwara, Kozo ; [et al.]

International Union of Crystallography

In: Journal of Applied Crystallography. 2006; 39(3): 443-445. Published 2006 May 10. doi: 10.1107/s0021889806011939.

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Publication Date: 2006-05-10

Description: Si (111) wafers deformed at elevated temperatures into cylindrical or hemispherical shapes have been examined by X-ray diffraction. Well defined 333 peaks shifted with in-plane distance from the centre of the wafer as determined by ω scans. The shift of the peak position agreed with the curvature of the Si wafer, suggesting that the Si (111) lattice plane can be designed on an arbitrarily curved surface by this method. These crystals have potential for innovative applications in X-ray instrumentation, for both diffraction/scattering and spectroscopy.

Print ISSN: 0021-8898

Electronic ISSN: 1600-5767

Topics: Geosciences , Physics

Published by International Union of Crystallography

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Contrast matching of an Si substrate with polymer films by anomalous dispersion at the SiKabsorption edge (2011)

Okuda, Hiroshi ; Takeshita, Kohki ; Ochiai, Shojiro ; [et al.]

International Union of Crystallography

In: Journal of Applied Crystallography. 2011; 45(1): 119-121. Published 2011 Dec 13. doi: 10.1107/s002188981105206x.

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Publication Date: 2011-12-13

Description: Anomalous dispersion at the SiKabsorption edge has been used to control the reflection from the interface between a film and an Si substrate, which otherwise complicates the nanostructure analysis of such a film, particularly for the soft-matter case, in grazing-incidence small-angle scattering. Such a reflectionless condition has been chosen for a triblock copolymer thin film, and two-dimensional grazing-incidence small-angle scattering patterns were obtained without the effect of the reflection. The present approach is useful for analysing nanostructures without introducing complicated corrections arising from the reflection.

Print ISSN: 0021-8898

Electronic ISSN: 1600-5767

Topics: Geosciences , Physics

Published by International Union of Crystallography

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Precursory microstructures in Zr–Cu–Al–Ni bulk metallic glasses examined by anomalous small-angle scattering at the Zr K edge (2007)

Okuda, Hiroshi ; Murase, Isao ; Ochiai, Shojiro ; [et al.]

International Union of Crystallography

In: Journal of Applied Crystallography. 2007; 40(s1): s138-s141. Published 2007 Feb 17. doi: 10.1107/s0021889807003524.

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Publication Date: 2007-02-17

Print ISSN: 0021-8898

Electronic ISSN: 1600-5767

Topics: Geosciences , Physics

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Point-focusing monochromator crystal realized by hot plastic deformation of a Ge wafer (2008)

Okuda, Hiroshi ; Nakajima, Kazuo ; Fujiwara, Kozo ; [et al.]

International Union of Crystallography

In: Journal of Applied Crystallography. 2008; 41(4): 798-799. Published 2008 Jun 14. doi: 10.1107/s0021889808016282.

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Publication Date: 2008-06-14

Description: Pre-polished Ge(111) single-crystal wafers were deformed just below the melting temperature to prepare point-focusing Johansson monochromator crystals. The (111) lattice plane had curvature 2Rin the focusing plane andRperpendicular to it, with a hemispherical inner surface with a radius ofR= 600 mm. By using CuKα radiation, the diverging X-ray beam was focused onto a small spot.

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Topics: Geosciences , Physics

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Near-surface relaxation structure of annealed block copolymer film on Si substrates examined by grazing-incidence small-angle scattering utilizing soft X-rays (2011)

Okuda, Hiroshi ; Takeshita, Kohki ; Ochiai, Shojiro ; [et al.]

International Union of Crystallography

In: Journal of Applied Crystallography. 2011; 44(2): 380-384. Published 2011 Feb 11. doi: 10.1107/s0021889811003578.

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Publication Date: 2011-02-11

Description: Two-dimensional grazing-incidence small-angle X-ray scattering (GISAXS) measurements of SEBS8 block copolymer films deposited on Si(001) substrates have been performed to demonstrate depth-sensitive GISAXS utilizing soft X-rays of 1.77 keV. Remarkable elongation of the Bragg spots in theqzdirection, corresponding to microphase separation, was observed for an angle of incidence close to the critical angle. The elongation was explained in terms of the penetration depth, which limits the effective size in the direction perpendicular to the sample surface. Lattice distortion near the surface was confirmed.

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Anomalous small-angle scattering from nanoquasicrystalline precipitates in Zr80Pt20ribbons (2008)

Okuda, Hiroshi ; Fukumoto, Takefumi ; Saida, Junji ; [et al.]

International Union of Crystallography

In: Journal of Applied Crystallography. 2008; 41(4): 675-679. Published 2008 Jun 14. doi: 10.1107/s0021889808015781.

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Publication Date: 2008-06-14

Description: Anomalous small-angle X-ray scattering (ASAXS) profiles of Zr80Pt20ribbons have been measured at the ZrKabsorption edge. By annealing the melt-spun ribbons at 800 K, well defined SAXS patterns from nanoquasicrystals were observed, although the compositions of the quasicrystals (QC) and the amorphous matrix have previously been reported to be the same. The SAXS intensities were found to show a small anomalous effect at the ZrKedge. Contrast analysis suggested that the origin of the small-angle scattering is a small compositional fluctuation coupled with a small density difference, which enhances SAXS intensity but reduces the anomalous effect. A constant ASAXS intensity ratio for QC microstructure suggests that the ratio of the composition difference to the density difference between QC and the amorphous matrix is almost constant for the ZrPt ribbons examined here.

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Topics: Geosciences , Physics

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