Publikationsdatum:
2011-08-27
Beschreibung:
Author(s): M. Barbagallo, T. Stollenwerk, J. Kroha, N.-J. Steinke, N. D. M. Hine, J. F. K. Cooper, C. H. W. Barnes, A. Ionescu, P. M. D. S. Monteiro, J.-Y. Kim, K. R. A. Ziebeck, C. J. Kinane, R. M. Dalgliesh, T. R. Charlton, and S. Langridge We have studied how the magnetic properties of oxygen-deficient EuO sputtered thin films vary as a function of thickness. The magnetic moment, measured by polarized neutron reflectometry, and the Curie temperature are found to decrease with reducing thickness. Our results indicate that these surface... [Phys. Rev. B 84, 075219] Published Fri Aug 26, 2011
Schlagwort(e):
Semiconductors I: bulk
Print ISSN:
1098-0121
Digitale ISSN:
1095-3795
Thema:
Physik
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