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2010 (430)
Journal of Organic Chemistry. 2010; 75(1): 152-161. Published 2010 Jan 01. doi: 10.1021/jo902256r. (1)
Journal of Organic Chemistry. 2010; 75(10): 3183-3192. Published 2010 May 21. doi: 10.1021/jo100083t. (1)
Journal of Organic Chemistry. 2010; 75(10): 3371-3380. Published 2010 May 21. doi: 10.1021/jo100373w. (1)
Journal of Organic Chemistry. 2010; 75(10): 3465-3468. Published 2010 May 21. doi: 10.1021/jo1003339. (1)
Journal of Organic Chemistry. 2010; 75(10): 3499-3502. Published 2010 May 21. doi: 10.1021/jo100407s. (1)
Journal of Organic Chemistry. 2010; 75(11): 3569-3577. Published 2010 Jun 04. doi: 10.1021/jo1002714. (1)
Journal of Organic Chemistry. 2010; 75(11): 3705-3714. Published 2010 Jun 04. doi: 10.1021/jo1004668. (1)
Journal of Organic Chemistry. 2010; 75(11): 3886-3889. Published 2010 Jun 04. doi: 10.1021/jo100454m. (1)
Journal of Organic Chemistry. 2010; 75(11): 3897-3899. Published 2010 Jun 04. doi: 10.1021/jo100537q. (1)
Journal of Organic Chemistry. 2010; 75(11): 3931-3934. Published 2010 Jun 04. doi: 10.1021/jo100614b. (1)
Journal of Organic Chemistry. 2010; 75(12): 3965-3974. Published 2010 Jun 18. doi: 10.1021/jo100554j. (1)
Journal of Organic Chemistry. 2010; 75(12): 3975-3982. Published 2010 Jun 18. doi: 10.1021/jo1005075. (1)
Journal of Organic Chemistry. 2010; 75(12): 4014-4024. Published 2010 Jun 18. doi: 10.1021/jo100172t. (1)
Journal of Organic Chemistry. 2010; 75(12): 4025-4038. Published 2010 Jun 18. doi: 10.1021/jo100286r. (1)
Journal of Organic Chemistry. 2010; 75(12): 4078-4085. Published 2010 Jun 18. doi: 10.1021/jo1004197. (1)
Journal of Organic Chemistry. 2010; 75(12): 4154-4160. Published 2010 Jun 18. doi: 10.1021/jo100561u. (1)
Journal of Organic Chemistry. 2010; 75(13): 4441-4452. Published 2010 Jul 02. doi: 10.1021/jo100433k. (1)
Journal of Organic Chemistry. 2010; 75(13): 4508-4513. Published 2010 Jul 02. doi: 10.1021/jo100679d. (1)
Journal of Organic Chemistry. 2010; 75(13): 4608-4611. Published 2010 Jun 04. doi: 10.1021/jo100489k. (1)
Journal of Organic Chemistry. 2010; 75(13): 4652-4655. Published 2010 Jul 02. doi: 10.1021/jo100844g. (1)
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52537

Journal

Journal of Organic Chemistry. 2010; 75(1): 152-161. Published 2010 Jan 01. doi: 10.1021/jo902256r. (1)
Journal of Organic Chemistry. 2010; 75(10): 3183-3192. Published 2010 May 21. doi: 10.1021/jo100083t. (1)
Journal of Organic Chemistry. 2010; 75(10): 3371-3380. Published 2010 May 21. doi: 10.1021/jo100373w. (1)
Journal of Organic Chemistry. 2010; 75(10): 3465-3468. Published 2010 May 21. doi: 10.1021/jo1003339. (1)
Journal of Organic Chemistry. 2010; 75(10): 3499-3502. Published 2010 May 21. doi: 10.1021/jo100407s. (1)

Journal of Organic Chemistry. 2010; 75(11): 3569-3577. Published 2010 Jun 04. doi: 10.1021/jo1002714. (1)

Journal of Organic Chemistry. 2010; 75(11): 3705-3714. Published 2010 Jun 04. doi: 10.1021/jo1004668. (1)

Journal of Organic Chemistry. 2010; 75(11): 3886-3889. Published 2010 Jun 04. doi: 10.1021/jo100454m. (1)

Journal of Organic Chemistry. 2010; 75(11): 3897-3899. Published 2010 Jun 04. doi: 10.1021/jo100537q. (1)

Journal of Organic Chemistry. 2010; 75(11): 3931-3934. Published 2010 Jun 04. doi: 10.1021/jo100614b. (1)

Journal of Organic Chemistry. 2010; 75(12): 3965-3974. Published 2010 Jun 18. doi: 10.1021/jo100554j. (1)

Journal of Organic Chemistry. 2010; 75(12): 3975-3982. Published 2010 Jun 18. doi: 10.1021/jo1005075. (1)

Journal of Organic Chemistry. 2010; 75(12): 4014-4024. Published 2010 Jun 18. doi: 10.1021/jo100172t. (1)

Journal of Organic Chemistry. 2010; 75(12): 4025-4038. Published 2010 Jun 18. doi: 10.1021/jo100286r. (1)

Journal of Organic Chemistry. 2010; 75(12): 4078-4085. Published 2010 Jun 18. doi: 10.1021/jo1004197. (1)

Journal of Organic Chemistry. 2010; 75(12): 4154-4160. Published 2010 Jun 18. doi: 10.1021/jo100561u. (1)

Journal of Organic Chemistry. 2010; 75(13): 4441-4452. Published 2010 Jul 02. doi: 10.1021/jo100433k. (1)

Journal of Organic Chemistry. 2010; 75(13): 4508-4513. Published 2010 Jul 02. doi: 10.1021/jo100679d. (1)

Journal of Organic Chemistry. 2010; 75(13): 4608-4611. Published 2010 Jun 04. doi: 10.1021/jo100489k. (1)

Journal of Organic Chemistry. 2010; 75(13): 4652-4655. Published 2010 Jul 02. doi: 10.1021/jo100844g. (1)

1000

52537

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Energy-sensitive imaging detector applied to the dissociative recombination ofD2H+ (2010)

Buhr, H. ; Mendes, M. B. ; Novotný, O. ; [et al.]

American Physical Society

In: Physical Review A. 2010; 81(6): 062702. Published 2010 Jun 07. doi: 10.1103/physreva.81.062702.

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Publication Date: 2010-06-07

Print ISSN: 1050-2947

Electronic ISSN: 1094-1622

Topics: Electrical Engineering, Measurement and Control Technology , Physics

Published by American Physical Society

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Inner-shell photodetachment from Fe− (2010)

Dumitriu, I. ; Bilodeau, R. C. ; Gorczyca, T. W. ; [et al.]

American Physical Society

In: Physical Review A. 2010; 81(5): 053404. Published 2010 May 10. doi: 10.1103/physreva.81.053404.

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Publication Date: 2010-05-10

Print ISSN: 1050-2947

Electronic ISSN: 1094-1622

Topics: Electrical Engineering, Measurement and Control Technology , Physics

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Tracing the photodissociation probability ofH2+in intense fields using chirped laser pulses (2010)

Prabhudesai, Vaibhav S. ; Lev, Uri ; Natan, Adi ; [et al.]

American Physical Society

In: Physical Review A. 2010; 81(2): 023401. Published 2010 Feb 03. doi: 10.1103/physreva.81.023401.

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Publication Date: 2010-02-03

Print ISSN: 1050-2947

Electronic ISSN: 1094-1622

Topics: Electrical Engineering, Measurement and Control Technology , Physics

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Search for dimer emission from photoexcitedAl4− (2010)

Aviv, O. ; Toker, Y. ; Rajput, J. ; [et al.]

American Physical Society

In: Physical Review A. 2010; 82(3): 035201. Published 2010 Sep 17. doi: 10.1103/physreva.82.035201.

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Publication Date: 2010-09-17

Print ISSN: 1050-2947

Electronic ISSN: 1094-1622

Topics: Electrical Engineering, Measurement and Control Technology , Physics

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Short-wavelength soft-x-ray laser pumped in double-pulse single-beam non-normal incidence (2010)

Zimmer, D. ; Ros, D. ; Guilbaud, O. ; [et al.]

American Physical Society

In: Physical Review A. 2010; 82(1): 013803. Published 2010 Jul 06. doi: 10.1103/physreva.82.013803.

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Publication Date: 2010-07-06

Print ISSN: 1050-2947

Electronic ISSN: 1094-1622

Topics: Electrical Engineering, Measurement and Control Technology , Physics

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Inner-shell photodetachment fromRu− (2010)

Dumitriu, I. ; Bilodeau, R. C. ; Gorczyca, T. W. ; [et al.]

American Physical Society

In: Physical Review A. 2010; 82(4): 043434. Published 2010 Oct 26. doi: 10.1103/physreva.82.043434.

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Publication Date: 2010-10-26

Print ISSN: 1050-2947

Electronic ISSN: 1094-1622

Topics: Electrical Engineering, Measurement and Control Technology , Physics

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Negative refraction with low absorption using Raman transitions with magnetoelectric coupling (2010)

Sikes, D. E. ; Yavuz, D. D.

American Physical Society

In: Physical Review A. 2010; 82(1): 011806. Published 2010 Jul 30. doi: 10.1103/physreva.82.011806.

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Publication Date: 2010-07-30

Print ISSN: 1050-2947

Electronic ISSN: 1094-1622

Topics: Electrical Engineering, Measurement and Control Technology , Physics

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Giant Kerr nonlinearities using refractive-index enhancement (2010)

Yavuz, D. D. ; Sikes, D. E.

American Physical Society

In: Physical Review A. 2010; 81(3): 035804. Published 2010 Mar 29. doi: 10.1103/physreva.81.035804.

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Publication Date: 2010-03-29

Print ISSN: 1050-2947

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Topics: Electrical Engineering, Measurement and Control Technology , Physics

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Site-selective ionization and relaxation dynamics in heterogeneous nanosystems (2010)

Hoener, M. ; Rolles, D. ; Aguilar, A. ; [et al.]

American Physical Society

In: Physical Review A. 2010; 81(2): 021201. Published 2010 Feb 01. doi: 10.1103/physreva.81.021201.

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Publication Date: 2010-02-01

Print ISSN: 1050-2947

Electronic ISSN: 1094-1622

Topics: Electrical Engineering, Measurement and Control Technology , Physics

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Electron affinity of indium and the fine structure of In−measured using infrared photodetachment threshold spectroscopy (2010)

Walter, C. W. ; Gibson, N. D. ; Carman, D. J. ; [et al.]

American Physical Society

In: Physical Review A. 2010; 82(3): 032507. Published 2010 Sep 17. doi: 10.1103/physreva.82.032507.

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Publication Date: 2010-09-17

Print ISSN: 1050-2947

Electronic ISSN: 1094-1622

Topics: Electrical Engineering, Measurement and Control Technology , Physics

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hits 1 - 10 | 430 hits