Publikationsdatum:
2017-08-31
Beschreibung:
Author(s): Y. L. Wang, G. Fabbris, D. Meyers, N. H. Sung, R. E. Baumbach, E. D. Bauer, P. J. Ryan, J.-W. Kim, X. Liu, M. P. M. Dean, G. Kotliar, and X. Dai Resonant elastic x-ray scattering is a powerful technique for measuring multipolar order parameters. In this paper, we theoretically and experimentally study the possibility of using this technique to detect the proposed multipolar order parameters in URu 2 Si 2 at the U- L 3 edge with the electric quadr... [Phys. Rev. B 96, 085146] Published Wed Aug 30, 2017
Schlagwort(e):
Electronic structure and strongly correlated systems
Print ISSN:
1098-0121
Digitale ISSN:
1095-3795
Thema:
Physik
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